MC9S12E128CPVE Freescale Semiconductor, MC9S12E128CPVE Datasheet - Page 583

IC MCU 128K FLASH 25MHZ 112-LQFP

MC9S12E128CPVE

Manufacturer Part Number
MC9S12E128CPVE
Description
IC MCU 128K FLASH 25MHZ 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheets

Specifications of MC9S12E128CPVE

Core Processor
HCS12
Core Size
16-Bit
Speed
25MHz
Connectivity
EBI/EMI, I²C, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
91
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
2.35 V ~ 2.75 V
Data Converters
A/D 16x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
112-LQFP
Processor Series
S12E
Core
HCS12
Data Bus Width
16 bit
Data Ram Size
8 KB
Interface Type
SCI/SPI
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
92
Number Of Timers
12
Operating Supply Voltage
3.135 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWHCS12
Minimum Operating Temperature
- 40 C
On-chip Adc
16-ch x 10-bit
On-chip Dac
2-ch x 8-bit
Controller Family/series
HCS12/S12X
No. Of I/o's
90
Ram Memory Size
8KB
Cpu Speed
25MHz
No. Of Timers
4
Embedded Interface Type
I2C, SCI, SPI
Rohs Compliant
Yes
For Use With
M68EVB912E128 - BOARD EVAL FOR MC9S12E128/64
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

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A.4.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
1
2
3
Freescale Semiconductor
Conditions are shown in
Num C
T
application.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to
25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please refer
to Engineering Bulletin EB618.
Spec table quotes typical endurance evaluated at 25 C for this product family, typical endurance at various temperature can
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer to
Engineering Bulletin EB619.
1
2
3
4
Javg
will not exeed 85 C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention after 10,000 program/erase cycles at an
C Data retention with <100 program/erase cycles at an
C Number of program/erase cycles
C Number of program/erase cycles
average junction temperature of T
average junction temperature T
(–40 C
(0 C
NVM Reliability
T
J
T
J
140 C)
Table A-4
0 C)
unless otherwise noted
Rating
Table A-15. NVM Reliability Characteristics
Javg
MC9S12E128 Data Sheet, Rev. 1.07
Javg
Flash Reliability Characteristics
85 C
85 C
Symbol
t
FLRET
n
FL
10,000
10,000
Min
15
20
1
Appendix A Electrical Characteristics
100,000
100
100
Typ
2
2
3
Max
Cycles
Years
Unit
583

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