MC9S12XEP100CAL Freescale Semiconductor, MC9S12XEP100CAL Datasheet - Page 1096

IC MCU 16BIT 1M FLASH 112-LQFP

MC9S12XEP100CAL

Manufacturer Part Number
MC9S12XEP100CAL
Description
IC MCU 16BIT 1M FLASH 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheet

Specifications of MC9S12XEP100CAL

Core Processor
HCS12X
Core Size
16-Bit
Speed
50MHz
Connectivity
CAN, EBI/EMI, I²C, IrDA, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
91
Program Memory Size
1MB (1M x 8)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
64K x 8
Voltage - Supply (vcc/vdd)
1.72 V ~ 5.5 V
Data Converters
A/D 16x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
112-LQFP
Processor Series
S12XE
Core
HCS12
Data Bus Width
16 bit
Data Ram Size
64 KB
Interface Type
CAN/SCI/SPI
Maximum Clock Frequency
50 MHz
Number Of Programmable I/os
91
Number Of Timers
25
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWHCS12
Development Tools By Supplier
KIT33812ECUEVME, EVB9S12XEP100, DEMO9S12XEP100
Minimum Operating Temperature
- 40 C
On-chip Adc
16-ch x 12-bit
Package
112LQFP
Family Name
HCS12X
Maximum Speed
50 MHz
Operating Supply Voltage
1.8|2.8|5 V
For Use With
EVB9S12XEP100 - BOARD EVAL FOR MC9S12XEP100DEMO9S12XEP100 - BOARD DEMO FOR MC9S12XEP100
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Chapter 28 768 KByte Flash Module (S12XFTM768K4V2)
28.3.2.6
The FERCNFG register enables the Flash error interrupts for the FERSTAT flags.
All assigned bits in the FERCNFG register are readable and writable.
1096
PGMERIE
EPVIOLIE
ERSERIE
Offset Module Base + 0x0005
Reset
FDFD
FSFD
Field
Field
1
0
7
6
4
W
R
ERSERIE
read operations and check the associated interrupt routine. The FDFD bit is cleared by writing a 0 to FDFD. The
FECCR registers will not be updated during the Flash array read operation with FDFD set unless an actual
double bit fault is detected.
0 Flash array read operations will set the DFDIF flag in the FERSTAT register only if a double bit fault is detected
1 Any Flash array read operation will force the DFDIF flag in the FERSTAT register to be set (see
Force Single Bit Fault Detect
read operations and check the associated interrupt routine. The FSFD bit is cleared by writing a 0 to FSFD. The
FECCR registers will not be updated during the Flash array read operation with FSFD set unless an actual single
bit fault is detected.
0 Flash array read operations will set the SFDIF flag in the FERSTAT register only if a single bit fault is detected
1 Flash array read operation will force the SFDIF flag in the FERSTAT register to be set (see
EEE Erase Error Interrupt Enable — The ERSERIE bit controls interrupt generation when a failure is detected
during an EEE erase operation.
0 ERSERIF interrupt disabled
1 An interrupt will be requested whenever the ERSERIF flag is set (see
EEE Program Error Interrupt Enable — The PGMERIE bit controls interrupt generation when a failure is
detected during an EEE program operation.
0 PGMERIF interrupt disabled
1 An interrupt will be requested whenever the PGMERIF flag is set (see
EEE Protection Violation Interrupt Enable — The EPVIOLIE bit controls interrupt generation when a
protection violation is detected during a write to the buffer RAM EEE partition.
0 EPVIOLIF interrupt disabled
1 An interrupt will be requested whenever the EPVIOLIF flag is set (see
Force Double Bit Fault Detect — The FDFD bit allows the user to simulate a double bit fault during Flash array
Flash Error Configuration Register (FERCNFG)
0
7
Section
register is set (see
and an interrupt will be generated as long as the SFDIE interrupt enable in the FERCNFG register is set (see
Section
= Unimplemented or Reserved
28.3.2.7) and an interrupt will be generated as long as the DFDIE interrupt enable in the FERCNFG
28.3.2.6)
PGMERIE
Figure 28-10. Flash Error Configuration Register (FERCNFG)
0
6
Table 28-15. FCNFG Field Descriptions (continued)
Section
MC9S12XE-Family Reference Manual , Rev. 1.23
Table 28-16. FERCNFG Field Descriptions
28.3.2.6)
0
0
5
The FSFD bit allows the user to simulate a single bit fault during Flash array
EPVIOLIE
0
4
Description
Description
ERSVIE1
0
3
ERSVIE0
Section
Section
Section
0
2
28.3.2.8)
28.3.2.8)
28.3.2.8)
Freescale Semiconductor
DFDIE
0
1
Section
SFDIE
28.3.2.7)
0
0

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