UPD70F3765GF-GAT-AX Renesas Electronics America, UPD70F3765GF-GAT-AX Datasheet - Page 714
UPD70F3765GF-GAT-AX
Manufacturer Part Number
UPD70F3765GF-GAT-AX
Description
MCU 32BIT V850ES/JX3-H 128-LQFP
Manufacturer
Renesas Electronics America
Series
V850ES/Jx3-Hr
Datasheet
1.UPD70F3760GC-UEU-AX.pdf
(1512 pages)
Specifications of UPD70F3765GF-GAT-AX
Core Processor
RISC
Core Size
32-Bit
Speed
48MHz
Connectivity
CSI, EBI/EMI, I²C, UART/USART, USB
Peripherals
DMA, LVD, PWM, WDT
Number Of I /o
96
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
40K x 8
Voltage - Supply (vcc/vdd)
2.85 V ~ 3.6 V
Data Converters
A/D 12x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
UPD70F3765GF-GAT-AX
Manufacturer:
Renesas Electronics America
Quantity:
10 000
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V850ES/JG3-H, V850ES/JH3-H
R01UH0042EJ0400 Rev.4.00
Sep 30, 2010
(7) Integral linearity error
(8) Conversion time
(9) Sampling time
This error indicates the extent to which the conversion characteristics differ from the ideal linear relationship. It
indicates the maximum value of the difference between the actually measured value and its theoretical value where
the zero-scale error and full-scale error are 0.
This is the time required to obtain a digital output after each trigger has been generated.
The conversion time in the characteristics table includes the sampling time.
This is the time for which the analog switch is ON to load an analog voltage to the sample & hold circuit.
Sampling time
1 ...... 1
0 ...... 0
Figure 15-21. Integral Linearity Error
0
Figure 15-22. Sampling Time
Ideal line
Conversion time
Analog input
Integral
linearity error
AV
REF0
CHAPTER 15 A/D CONVERTER
Page 714 of 1509
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