MMC2107CFCPV33 Freescale Semiconductor, MMC2107CFCPV33 Datasheet - Page 494

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MMC2107CFCPV33

Manufacturer Part Number
MMC2107CFCPV33
Description
IC MCU 33MHZ 128K FLASH 144-LQFP
Manufacturer
Freescale Semiconductor
Series
MCorer
Datasheet

Specifications of MMC2107CFCPV33

Core Processor
M210
Core Size
32-Bit
Speed
33MHz
Connectivity
EBI/EMI, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
72
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LQFP
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
33 MHz
Number Of Programmable I/os
32
Number Of Timers
4 bit
Operating Supply Voltage
0 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Lead Free Status / Rohs Status
No RoHS Version Available

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Queued Analog-to-Digital Converter (QADC)
18.11.5 Accommodating Positive/Negative Stress Conditions
Technical Data
494
Positive or negative stress refers to conditions which exceed nominally
defined operating limits. Examples include applying a voltage exceeding
the normal limit on an input (for example, voltages outside of the
suggested supply/reference ranges) or causing currents into or out of
the pin which exceed normal limits. QADC specific considerations are
voltages greater than V
input which cause excessive currents into or out of the input. Refer to
Section 22. Electrical Specifications
magnitudes.
Either stress conditions can potentially disrupt conversion results on
neighboring inputs. Parasitic devices, associated with CMOS
processes, can cause an immediate disruptive influence on neighboring
pins. Common examples of parasitic devices are diodes to substrate and
bipolar devices with the base terminal tied to substrate (V
ground). Under stress conditions, current injected on an adjacent pin can
cause errors on the selected channel by developing a voltage drop
across the selected channel’s impedances.
Figure 18-51
input pin is subjected to negative stress conditions.
positive stress conditions can activate a similar PNP transistor.
Freescale Semiconductor, Inc.
For More Information On This Product,
Queued Analog-to-Digital Converter (QADC)
Figure 18-51. Input Pin Subjected to Negative Stress
Figure 18-52. Input Pin Subjected to Positive Stress
Go to: www.freescale.com
V
shows an active parasitic bipolar NPN transistor when an
In
V
In
V
+
V
Stress
Stress
+
DDA
, V
R
R
RH
10 K
Selected
Stress
R
R
Selected
10 K
Stress
,
or less than V
I
INJP
I
In
I
INJN
I
In
PARASITIC
AN
AN
for more information on exact
DEVICE
PARASITIC
AN
n+1
AN
n
DEVICE
n+1
n
PIN UNDER
ADJACENT
STRESS
PIN UNDER
ADJACENT
PIN
STRESS
SSA
PIN
applied to an analog
Figure 18-52
MMC2107 – Rev. 2.0
V
DDA
SSI
/V
MOTOROLA
SSA
shows

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