MMC2107CFCPV33 Freescale Semiconductor, MMC2107CFCPV33 Datasheet - Page 535

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MMC2107CFCPV33

Manufacturer Part Number
MMC2107CFCPV33
Description
IC MCU 33MHZ 128K FLASH 144-LQFP
Manufacturer
Freescale Semiconductor
Series
MCorer
Datasheet

Specifications of MMC2107CFCPV33

Core Processor
M210
Core Size
32-Bit
Speed
33MHz
Connectivity
EBI/EMI, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
72
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LQFP
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
33 MHz
Number Of Programmable I/os
32
Number Of Timers
4 bit
Operating Supply Voltage
0 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Lead Free Status / Rohs Status
No RoHS Version Available

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21.2 Introduction
MMC2107 – Rev. 2.0
MOTOROLA
21.14.12.3
21.14.12.4
21.14.12.5
21.14.13 Instruction Address FIFO Buffer (PC FIFO) . . . . . . . . . . . 580
21.14.14 Reserved Test Control Registers . . . . . . . . . . . . . . . . . . .581
21.14.15 Serial Protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 581
21.14.16 OnCE Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 582
21.14.17 Target Site Debug System Requirements . . . . . . . . . . . . 582
21.14.18 Interface Connector for JTAG/OnCE Serial Port . . . . . . . 582
The MMC2107 has two JTAG (Joint Test Action Group) TAP (test
access port) controllers:
At power-up, only the top-level TAP controller will be visible. If desired,
a user can then enable the low-level OnCE controller which will in turn
disable the top-level TAP controller. The top-level TAP controller will
remain disabled until either power is removed and reapplied to the
MMC2107 or until the test reset signal, TRST, is asserted (logic 0).
The OnCE TAP controller can be enabled in either of two ways:
Refer to
1. A top-level controller that allows access to the MMC2107’s
2. A low-level OnCE (on-chip emulation) controller that allows
1. With the top-level TAP controller in its test-logic-reset state:
2. Shift the ENABLE_MCU_ONCE instruction, 0x3, into the top-level
Freescale Semiconductor, Inc.
For More Information On This Product,
boundary scan (external pins) register, IDCODE register, and
bypass register
access to MMC2107’s central processor unit (CPU) and
debugger-related registers
a. Deassert TRST, test reset (logic1)
b. Assert DE, the debug event (logic 0) for two TCLK, test clock,
TAP controller’s instruction register (IR) and pass through the TAP
controller state update-IR.
Figure
JTAG Test Access Port and OnCE
cycles
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Control State Register . . . . . . . . . . . . . . . . . . . . . . . . . 577
Writeback Bus Register . . . . . . . . . . . . . . . . . . . . . . . . 579
Processor Status Register . . . . . . . . . . . . . . . . . . . . . . 579
21-1.
JTAG Test Access Port and OnCE
Technical Data
Introduction
535

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