MMC2107CFCPV33 Freescale Semiconductor, MMC2107CFCPV33 Datasheet - Page 538

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MMC2107CFCPV33

Manufacturer Part Number
MMC2107CFCPV33
Description
IC MCU 33MHZ 128K FLASH 144-LQFP
Manufacturer
Freescale Semiconductor
Series
MCorer
Datasheet

Specifications of MMC2107CFCPV33

Core Processor
M210
Core Size
32-Bit
Speed
33MHz
Connectivity
EBI/EMI, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
72
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LQFP
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
33 MHz
Number Of Programmable I/os
32
Number Of Timers
4 bit
Operating Supply Voltage
0 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Lead Free Status / Rohs Status
No RoHS Version Available

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JTAG Test Access Port and OnCE
21.3.1 Test Clock (TCLK)
21.3.2 Test Mode Select (TMS)
21.3.3 Test Data Input (TDI)
21.3.4 Test Data Output (TDO)
21.3.5 Test Reset (TRST)
21.3.6 Debug Event (DE)
Technical Data
538
TCLK is a test clock input to synchronize the test logic. TCLK is
independent of the MMC2107 processor clock. It includes an internal
pullup resistor.
TMS is a test mode select input (with an internal pullup resistor) that is
sampled on the rising edge of TCLK to sequence the TAP controller’s
state machine.
TDI is a serial test data input (with an internal pullup resistor) that is
sampled on the rising edge of TCLK.
TDO is a three-state test data output that is actively driven in the shift-IR
and shift-DR controller states. TDO changes on the falling edge of
TCLK.
TRST is an active low asynchronous reset with an internal pullup resistor
that forces the TAP controller into the test-logic-reset state.
This is a bidirectional, active-low signal.
As an output, this signal will be asserted for three system clocks,
synchronous to the rising CLKOUT edge, to acknowledge that the CPU
has entered debug mode as a result of a debug request or a breakpoint
condition.
Freescale Semiconductor, Inc.
For More Information On This Product,
JTAG Test Access Port and OnCE
Go to: www.freescale.com
MMC2107 – Rev. 2.0
MOTOROLA

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