MMC2107CFCPV33 Freescale Semiconductor, MMC2107CFCPV33 Datasheet - Page 547

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MMC2107CFCPV33

Manufacturer Part Number
MMC2107CFCPV33
Description
IC MCU 33MHZ 128K FLASH 144-LQFP
Manufacturer
Freescale Semiconductor
Series
MCorer
Datasheet

Specifications of MMC2107CFCPV33

Core Processor
M210
Core Size
32-Bit
Speed
33MHz
Connectivity
EBI/EMI, SCI, SPI
Peripherals
POR, PWM, WDT
Number Of I /o
72
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LQFP
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
33 MHz
Number Of Programmable I/os
32
Number Of Timers
4 bit
Operating Supply Voltage
0 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Lead Free Status / Rohs Status
No RoHS Version Available

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21.10 Non-Scan Chain Operation
21.11 Boundary Scan
MMC2107 – Rev. 2.0
MOTOROLA
MMC2107 features a low-power stop mode. The interaction of the scan
chain interface with low-power stop mode is:
Keeping the TAP controller in the test-logic-reset state will ensure that
the scan chain test logic is kept transparent to the system logic. It is
recommended that TMS, TDI, TCLK, and TRST be pulled up. TRST
could be connected to ground. However, since there is a pullup on
TRST, some amount of current will result. JTAG will be initialized to the
test-logic-reset state on power-up without TRST asserted low due to the
JTAG power-on-reset internal input. The low-level TAP module in the
M•CORE also has the power-on-reset input.
The MMC2107 boundary-scan register contains 200 bits. This register
can be connected between TDI and TDO when EXTEST or
SAMPLE/PRELOAD instructions are selected. This register is used for
capturing signal pin data on the input pins, forcing fixed values on the
output signal pins, and selecting the direction and drive characteristics
(a logic value or high impedance) of the bidirectional and three-state
signal pins.
This IEEE 1149.1 standard-compliant boundary-scan register contains
bits for bonded-out and non-bonded signals excluding JTAG signals,
analog signals, power supplies, compliance enable pins, and clock
1. The TAP controller must be in the test-logic-reset state to either
2. The TCLK input is not blocked in low-power stop mode. To
3. The TMS, TDI, TRST pins include on-chip pullup resistors. In
Freescale Semiconductor, Inc.
For More Information On This Product,
enter or remain in the low-power stop mode. Leaving the
test-logic-reset state negates the ability to achieve low-power, but
does not otherwise affect device functionality.
consume minimal power, the TCLK input should be externally
connected to V
low-power stop mode, these three pins should remain either
unconnected or connected to V
consumption.
JTAG Test Access Port and OnCE
Go to: www.freescale.com
DD
.
DD
to achieve minimal power
JTAG Test Access Port and OnCE
Non-Scan Chain Operation
Technical Data
547

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