ADUC7039BCP6Z-RL Analog Devices Inc, ADUC7039BCP6Z-RL Datasheet - Page 8

• Manufacturer Part Number: ADUC7039BCP6Z-RL
• Description: Flash 64k ARM7 Dual 16-Bit ADC LIN I.C.
• Manufacturer: Analog Devices Inc
• Series: MicroConverter® ADuC7xxxr

Specifications of ADUC7039BCP6Z-RL

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 20.48MHz
• Connectivity: LIN, SPI
• Peripherals: POR, Temp Sensor, WDT
• Number Of I /o: 6
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 3.5 V ~ 18 V
• Data Converters: A/D 2x16b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 115°C
• Package / Case: 32-LFCSP
• Lead Free Status / RoHS Status: Lead free by exemption / RoHS compliant by exemption
• Eeprom Size: -
• Lead Free Status / RoHS Status: Lead free by exemption / RoHS compliant by exemption

ADuC7039
ABSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
AGND to DGND to VSS to IO_VSS
VBAT to AGND
VDD to VSS
LIN to IO_VSS
LIN Short-Circuit Current
Digital I/O Voltage to DGND
ADC Inputs to AGND
ESD (HBM) Rating
IEC61000-4-2 for LIN and VBAT
Storage Temperature
Junction Temperature
Lead Temperature
Soldering Reflow (15 sec)
1
200 mA can be sustained on the LIN pin for 2 seconds. The active internal
short circuit protection HVCFG[1] = 0 is required to be enabled on this
device during LIN operation and is the default operation. This disconnects
the LIN pin, if a short circuit event occurs, after the specified maximum
period of 90 μs.
A
HBM-ADI0082 (Based on
ANSI/ESD STM5.1-2007); All Pins
Except LIN and VBAT
LIN and VBAT
Transient
Continuous
= −40°C to +115°C, unless otherwise noted.
1
Rating
−0.3 V to +0.3 V
−22 V to +40 V
−0.3 V to +40 V
−16 V to +40 V
200 mA
−0.3 V to REG_DVDD + 0.3 V
−0.3 V to REG_AVDD + 0.3 V
2.5 kV
±6 kV
±7 kV
150°C
150°C
130°C
260°C
Rev. B | Page 8 of 92
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION