FDN306P Fairchild Semiconductor, FDN306P Datasheet - Page 2
![MOSFET P-CH 12V 2.6A SSOT3](/photos/5/45/54562/261-supersot-3_sml.jpg)
FDN306P
Manufacturer Part Number
FDN306P
Description
MOSFET P-CH 12V 2.6A SSOT3
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet
1.FDN306P.pdf
(5 pages)
Specifications of FDN306P
Fet Type
MOSFET P-Channel, Metal Oxide
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
40 mOhm @ 2.6A, 4.5V
Drain To Source Voltage (vdss)
12V
Current - Continuous Drain (id) @ 25° C
2.6A
Vgs(th) (max) @ Id
1.5V @ 250µA
Gate Charge (qg) @ Vgs
17nC @ 4.5V
Input Capacitance (ciss) @ Vds
1138pF @ 6V
Power - Max
460mW
Mounting Type
Surface Mount
Package / Case
3-SSOT, SuperSOT-3
Configuration
Single
Transistor Polarity
P-Channel
Resistance Drain-source Rds (on)
0.04 Ohm @ 4.5 V
Forward Transconductance Gfs (max / Min)
10 S
Drain-source Breakdown Voltage
12 V
Gate-source Breakdown Voltage
+/- 8 V
Continuous Drain Current
2.6 A
Power Dissipation
500 mW
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDN306PTR
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
FDN306P
Manufacturer:
Fairchild Semiconductor
Quantity:
55 538
Company:
Part Number:
FDN306P
Manufacturer:
FAIRCHILD
Quantity:
2 400
Part Number:
FDN306P
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
FDN306P-NL
Manufacturer:
FAI
Quantity:
20 000
Lot
Q20070335AAACLV
Q20070335ABACLV
Q20070335BAACLV
Q20070335BBACLV
Q20070335CAACLV
Q20070335CBACLV
Test: (High Temperature Reverse Bias) | Conditions: 150C, -16V | Standard: JESD22-A108
Lot
Q20070335AAHTRB
Q20070335ABHTRB
Test: (High Temperature Reverse Bias) | Conditions: 150C, -24V | Standard: JESD22-A108
Lot
Q20070335CAHTRB
Q20070335CBHTRB
Test: (High Temperature Reverse Bias) | Conditions: 150C, 24V | Standard: JESD22-A108
Lot
Q20070335BAHTRB
Q20070335BBHTRB
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, -16V | Standard: JESD22-A110
Lot
Q20070335AAHAST1
Q20070335ABHAST1
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, -24V | Standard: JESD22-A110
Lot
Q20070335CAHAST1
Q20070335CBHAST1
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 130C, 24V | Standard: JESD22-A110
Lot
Q20070335BAHAST1
Q20070335BBHAST1
Test: (Power Cycle) | Conditions: Delta 100C, 2 Min cycle | Standard: MIL-STD-750-1036
Lot
Q20070335AAPRCL
Q20070335ABPRCL
Q20070335BAPRCL
Q20070335BBPRCL
Q20070335CAPRCL
Q20070335CBPRCL
Test: (Precondition) | Conditions: | Standard: JESD22-A113
Lot
Q20070335AAPCNL1A
Q20070335ABPCNL1A
Q20070335BAPCNL1A
Q20070335BBPCNL1A
Q20070335CAPCNL1A
Q20070335CBPCNL1A
Device
FDC640P
FDC655AN
FDC654P
Device
FDC640P
Device
FDC654P
Device
FDC655AN
Device
FDC640P
Device
FDC654P
Device
FDC655AN
Device
FDC640P
FDC655AN
FDC654P
Device
FDC640P
FDC655AN
FDC654P
Setpoint
96-HOURS
96-HOURS
96-HOURS
96-HOURS
96-HOURS
96-HOURS
Setpoint
168-HOURS
500-HOURS
1000-HOURS
168-HOURS
500-HOURS
1000-HOURS
Setpoint
500-HOURS
1000-HOURS
500-HOURS
1000-HOURS
Setpoint
168-HOURS
500-HOURS
1000-HOURS
168-HOURS
500-HOURS
1000-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
96-HOURS
96-HOURS
Setpoint
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
5000-CYCLES
10000-CYCLES
Setpoint
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
Result
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/231
0/231
0/231
0/231
0/231
0/231
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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