AT87C52X2-3CSUV Atmel, AT87C52X2-3CSUV Datasheet - Page 36
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AT87C52X2-3CSUV
Manufacturer Part Number
AT87C52X2-3CSUV
Description
Microcontrollers (MCU) Microcontroller
Manufacturer
Atmel
Datasheet
1.AT87C52X2-3CSUV.pdf
(55 pages)
Specifications of AT87C52X2-3CSUV
Data Bus Width
8 bit
Program Memory Type
EPROM
Program Memory Size
8 KB
Data Ram Size
256 B
Interface Type
UART
Maximum Clock Frequency
30 MHz
Number Of Programmable I/os
32
Number Of Timers
3 bit
Operating Supply Voltage
5 V
Maximum Operating Temperature
+ 70 C
Mounting Style
Through Hole
Package / Case
PDIL-40
Minimum Operating Temperature
0 C
Lead Free Status / Rohs Status
No
Electrical
Characteristics
Absolute Maximum
Ratings
Power Consumption
Measurement
DC Parameters for
Standard Voltage
Table 22. DC Parameters in Standard Voltage
36
Ambiant Temperature Under Bias:
C = commercial......................................................0°C to 70°C
I = industrial ........................................................-40°C to 85°C
Storage Temperature .................................... -65°C to + 150°C
Voltage on V
Voltage on V
Voltage on Any Pin to V
Power Dissipation ........................................................... 1 W
Symbol
V
V
V
V
V
V
OL1
OL2
IH1
OL
IH
IL
(1)
TS8xCx2X2
Parameter
Input Low Voltage
Input High Voltage except XTAL1, RST
Input High Voltage, XTAL1, RST
Output Low Voltage, ports 1, 2, 3
Output Low Voltage, port 0
Output Low Voltage, ALE, PSEN
CC
PP
to V
to V
SS
SS
.........................................-0.5V to + 7 V
.......................................-0.5V to + 13 V
SS
..........................-0.5V to V
(6)
Since the introduction of the first C51 devices, every manufacturer made operating Icc
measurements under reset, which made sense for the designs were the CPU was run-
ning under reset. In Atmel new devices, the CPU is no more active during reset, so the
power consumption is very low but is not really representative of what will happen in the
customer system. That’s why, while keeping measurements under Reset, Atmel pre-
sents a new way to measure the operating Icc:
Using an internal test ROM, the following code is executed:
Label:
Ports 1, 2, 3 are disconnected, Port 0 is tied to FFh, EA = Vcc, RST = Vss, XTAL2 is not
connected and XTAL1 is driven by the clock.
This is much more representative of the real operating Icc.
T
T
A
A
= 0°C to +70°C; V
= -40°C to +85°C; V
(6)
CC
+ 0.5V
(2)
SS
SJMP Label (80 FE)
0.2 V
SS
= 0 V; V
0.7 V
= 0 V; V
Min
-0.5
CC
+ 0.9
CC
Notes:
CC
CC
= 5V ± 10%; F = 0 to 40 MHz.
= 5V ± 10%; F = 0 to 40 MHz.
Typ
1.
2. This value is based on the maximum allowable die
S
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions above those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions may affect device reliability.
temperature and the thermal resistance of the
package.
tresses at or above those listed under “ Absolute
0.2 V
V
V
CC
CC
Max
0.45
0.45
0.45
0.3
1.0
0.3
1.0
0.3
1.0
CC
+ 0.5
+ 0.5
- 0.1
Unit
V
V
V
V
V
V
V
V
V
V
V
V
Test Conditions
I
I
I
I
I
I
I
I
I
OL
OL
OL
OL
OL
OL
OL
OL
OL
= 100 µA
= 1.6 mA
= 3.5 mA
= 200 µA
= 3.2 mA
= 7.0 mA
= 100 µA
= 1.6 mA
= 3.5 mA
4184I–8051–02/08
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