LAXP2-17E-5FTN256E Lattice, LAXP2-17E-5FTN256E Datasheet - Page 74
LAXP2-17E-5FTN256E
Manufacturer Part Number
LAXP2-17E-5FTN256E
Description
IC FPGA AUTO 17K LUTS 256-BGA
Manufacturer
Lattice
Datasheet
1.LAXP2-5E-5TN144E.pdf
(83 pages)
Specifications of LAXP2-17E-5FTN256E
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LAXP2-17E-5FTN256E
Manufacturer:
BROADCOM
Quantity:
101
Company:
Part Number:
LAXP2-17E-5FTN256E
Manufacturer:
Lattice
Quantity:
44
Company:
Part Number:
LAXP2-17E-5FTN256E
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
Part Number:
LAXP2-17E-5FTN256E
Manufacturer:
LATTICE
Quantity:
20 000
Lattice Semiconductor
Switching Test Conditions
Figure 3-11 shows the output test load that is used for AC testing. The speci• c values for resistance, capacitance,
voltage, and other test conditions are shown in Table 3-6.
Figure 3-11. Output Test Load, LVTTL and LVCMOS Standards
Table 3-6. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
*CL Includes Test Fixture and Probe Capacitance
DUT
V
R1
1M¾
T
100
R
1
3-30
1M¾
100
R
CL*
2
Test Poi nt
0pF
C
DC and Switching Characteristics
LA-LatticeXP2 Family Data Sheet
L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.10
- 0.10
/2
/2
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
CCIO
CCIO
V
—
—
—
—
—
—
—
T