ne56632-xx NXP Semiconductors, ne56632-xx Datasheet - Page 12

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ne56632-xx

Manufacturer Part Number
ne56632-xx
Description
Active-low System Reset With Adjustable Delay Time
Manufacturer
NXP Semiconductors
Datasheet
Philips Semiconductors
TEST CIRCUITS
2003 Oct 14
Active-LOW system reset with adjustable delay time
PULSE
INPUT
C
D
5
1
NE56632-XX
Figure 28. Test circuit 2.
V
CC1
2
4
3
100 pF
V1
C
L
A1
R
L
10 F
/10 V
C
CRT
D
10 F
/10 V
SL01609
S3
Figure 27. Test circuit 1.
R
5.0 V
L
5
1
NE56632-XX
S1
12
2
A = DC amperemeter
V = DC voltmeter
CRT = oscilloscope
NOTES:
4
3
V2
S2
V
S(typ)
Figure 29. Input pulse.
– 0.4 V
SL01608
V
A2
CC2
V
S(typ)
NE56632-XX
+ 0.4 V
0V
Product data
SL01610

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