ne56632-xx NXP Semiconductors, ne56632-xx Datasheet - Page 5
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ne56632-xx
Manufacturer Part Number
ne56632-xx
Description
Active-low System Reset With Adjustable Delay Time
Manufacturer
NXP Semiconductors
Datasheet
1.NE56632-XX.pdf
(15 pages)
Philips Semiconductors
TYPICAL PERFORMANCE CURVES, NE56632-20
2003 Oct 14
Active-LOW system reset with adjustable delay time
Figure 7. Supply current (OFF time) versus temperature.
Figure 5. LOW-level output voltage versus temperature.
2.0050
2.0025
2.0000
1.9975
1.9950
1.9925
1.9900
1.9875
1.9850
0.225
0.220
0.215
0.210
0.205
0.200
0.195
0.190
0.185
Figure 3. Detection threshold versus temperature.
4.5
4.0
3.5
3.0
2.5
2.0
–40
–40
–40
Test Circuit 1
R
V
L
CC1
=
= V
–20
–20
–20
S(typ)
AMBIENT TEMPERATURE, T
/0.85
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
0
0
0
20
20
20
40
40
40
amb
Test Circuit 1
V
R
S1 = ON
amb
amb
Test Circuit 1
V
R
V
S1 = ON
CC1
L
CC
OL
L
= 4.7 k
60
( C)
60
60
( C)
( C)
= 4.7 k
= V
= HIGH-to-LOW
0.4 V
S(min)
80
80
80
– 0.05 V
SL01620
SL01622
SL01624
100
100
100
5
Figure 8. Min. operating threshold voltage versus temperature.
Figure 6. Supply current (ON time) versus temperature.
100
0.9
0.8
0.7
0.6
0.5
0.4
0.3
Figure 4. Hysteresis voltage versus temperature.
90
80
70
60
50
40
30
9
8
7
6
5
4
3
–40
–40
–40
Test Circuit 1
V
R
S1 = ON
Test Circuit 1
V
R
Test Circuit 1
R
V
S1 = ON
CC
CC1
OL
L
L
L
= 4.7 k
=
= 4.7 k
= LOW-to-HIGH-to-LOW
= V
0.4 V
–20
–20
–20
S(min)
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
– 0.05 V
0
0
0
20
20
20
40
40
40
NE56632-XX
amb
amb
amb
60
60
60
( C)
( C)
( C)
Product data
80
80
80
SL01621
SL01623
SL01625
100
100
100