ne56632-xx NXP Semiconductors, ne56632-xx Datasheet - Page 6
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ne56632-xx
Manufacturer Part Number
ne56632-xx
Description
Active-low System Reset With Adjustable Delay Time
Manufacturer
NXP Semiconductors
Datasheet
1.NE56632-XX.pdf
(15 pages)
Philips Semiconductors
TYPICAL PERFORMANCE CURVES, NE56632-20 (continued)
2003 Oct 14
Active-LOW system reset with adjustable delay time
Figure 9. Output current (ON time 1) versus temperature.
Figure 11. HIGH-to-LOW delay time versus temperature.
120
105
100
115
110
37
35
33
31
29
27
25
95
90
85
80
–40
–40
Test Circuit 1
V
V
V
R
S2 = ON
Test Circuit 2
C
R
C
CC1
CC2
O
L
L
L
D
= 0
= 100 pF
= 4.7 k
= 0.4 V
= 10 nF
= V
= 0.4 V
–20
–20
S(min)
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
– 0.05 V
0
0
20
V
t
20
PHL
CC
= (V
= Assertion Delay Time
S(typ)
40
40
+ 0.4 V) to (V
amb
amb
60
60
( C)
( C)
S(typ)
80
80
– 0.4 V)
SL01626
SL01628
100
100
6
Figure 10. LOW-to-HIGH delay time versus temperature.
100
90
80
70
60
50
40
–40
Test Circuit 2
C
R
C
L
L
D
= 100 pF
= 4.7 k
= 10 nF
–20
AMBIENT TEMPERATURE, T
0
V
t
20
PLH
CC
= (V
= Release Delay Time
S(typ)
40
NE56632-XX
– 0.4 V) to (V
amb
60
( C)
S(typ)
Product data
80
+ 0.4 V)
SL01627
100