ne56632-xx NXP Semiconductors, ne56632-xx Datasheet - Page 8

• Manufacturer Part Number: ne56632-xx
• Description: Active-low System Reset With Adjustable Delay Time
• Manufacturer: NXP Semiconductors

Philips Semiconductors
TYPICAL PERFORMANCE CURVES, NE56632-31 (continued)
2003 Oct 14
Active-LOW system reset with adjustable delay time
Figure 18. Output current (ON time 1) versus temperature.
Figure 20. LOW-to-HIGH delay time versus temperature.
180
160
140
120
100
80
60
40
–40
–40
Test Circuit 1
V
V
V
R
S2 = ON
Test Circuit 2
C
R
C
CC1
CC2
O
L
L
L
D
= 0
= 100 pF
= 4.7 k
= 0.4 V
= 10 nF
= V
= 0.4 V
–20
–20
S(min)
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
– 0.05 V
0
0
20
V
t
20
PLH
CC
= (V
= Release Delay Time
S(typ)
40
40
– 0.4 V) to (V
amb
amb
60
60
( C)
( C)
S(typ)
80
80
+ 0.4 V)
SL01635
SL01637
100
100
8
Figure 19. Output current (ON time 2) versus temperature.
Figure 21. HIGH-to-LOW delay time versus temperature.
160
150
140
130
120
110
100
37
35
33
31
29
27
90
80
–40
–40
Test Circuit 1
V
V
V
R
S2 = ON
Test Circuit 2
C
R
C
CC1
CC2
O
L
L
L
D
= 0
= 100 pF
= 4.7 k
= 0.4 V
= 10 nF
= V
= 0.4 V
–20
–20
S(min)
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
– 0.05 V
0
0
V
t
20
20
PHL
CC
= (V
= Assertion Delay Time
S(typ)
40
40
NE56632-XX
+ 0.4 V) to (V
amb
amb
60
60
( C)
( C)
S(typ)
Product data
80
80
– 0.4 V)
SL01636
SL01638
100
100