ADUM1100ARWZ AD [Analog Devices], ADUM1100ARWZ Datasheet - Page 6
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ADUM1100ARWZ
Manufacturer Part Number
ADUM1100ARWZ
Description
Manufacturer
AD [Analog Devices]
Datasheet
1.ADUM1100ARWZ.pdf
(8 pages)
AN-793
New ESD-Hardened iCouplers
To better support the use of iCouplers in harsh ESD
applications, Analog Devices is introducing a new
line of iCoupler products. The ADuM3xxx series takes
advantage of improved circuit designs and layouts to
increase iCoupler robustness to ESD events. These
new products are pin- and specification- compatible
with their ADuM1xxx series counterparts. For many
installed applications, the standard iCoupler products
work just fine. Therefore, both the standard ADuM1xxx
and the ESD-hardened ADuM3xxx series will continue
to be offered.
The part numbering for the ADuM3xxx series is analogous
to that of the standard product except that only Pb-free
models are provided. Table III gives examples of the part
numbering for the two product families.
Standard
Products
ADuM1100ARWZ
ADuM1201ARWZ
ADuM1301BRWZ
ADuM1402CRWZ
Table III. Part Numbering Examples for Various
Standard and ESD-Hardened iCoupler Products
ESD-Hardened
Products
ADuM3100ARWZ
ADuM3201ARWZ
ADuM3301BRWZ
ADuM3402CRWZ
–6–
Inside the ADuM3xxx Series iCoupler
Several design enhancements are incorporated into the
ADuM3xxx series iCouplers to create a more robust
device. Specific improvements include:
• ESD protection cells added to all input/output inter-
• Key metal trace resistances reduced using wider
• The SCR effect inherent in CMOS devices minimized
• Areas of high electric field concentration eliminated
• Supply pin overvoltage prevented with larger ESD
CONCLUSION
By following the guidelines set forth in this application
note, designers can be assured of success in their
application of iCouplers at the system level. Problems
with system-level tests can be anticipated using the
lumped-element circuit model presented for the iCoupler.
With this model and a good understanding of the various
system tests, designers can avoid problems by employing
the preventive techniques suggested in this document.
In situations where the recommendations cannot be
implemented due to cost, system design, or other
considerations, the new ADuM3xxx iCoupler provides an
alternative method of avoiding ESD/latch-up problems.
faces.
geometry and paralleling of lines with vias.
by use of guarding and isolation techniques between
PMOS and NMOS devices.
using 45 corners; on metal traces.
clamps between each supply pin and its respective
ground.
REV. 0