MAX1785EVMINIQU# Maxim Integrated, MAX1785EVMINIQU# Datasheet - Page 4
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MAX1785EVMINIQU#
Manufacturer Part Number
MAX1785EVMINIQU#
Description
Power Management IC Development Tools Evaluation System for MAX1785
Manufacturer
Maxim Integrated
Series
MAX1785r
Datasheet
1.MAX1785EVKIT.pdf
(5 pages)
V. Quality Assurance Information
VI. Reliability Evaluation
Maxim Integrated Products. All rights reserved.
A. Quality Assurance Contacts:
B. Outgoing Inspection Level:
C. Observed Outgoing Defect Rate:
D. Sampling Plan:
A. Accelerated Life Test
follows:
1000 hour life test monitors on its processes. This data is published in the Product Reliability Report found at http://www.maxim-
ic.com/.
B. Moisture Resistance Tests
C. E.S.D. and Latch-Up Testing
JESD22-A114. Latch-Up testing has shown that this device withstands a current of +/-100 mA.
=
MTTF
The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure Rate ( ) is calculated as
The following failure rate represents data collected from Maxim’s reliability monitor program. Maxim performs quarterly
The industry standard 85°C/85%RH or HAST testing is monitored per device process once a quarter.
The UC09-1 die type has been found to have all pins able to withstand a HBM transient pulse of +/-500 V per JEDEC
Current monitor data for the S4 Process results in a FIT Rate of 4.6 @ 25C and 79.2 @ 55C (0.8 eV, 60% UCL)
1
= 13.4 x 10
= 13.4 F.I.T. (60% confidence level @ 25°C)
=
-9
(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)
192 x 4340 x 80 x 2
1.83
(Chi square value for MTTF upper limit)
Ken Wendel (Director, Reliability Engineering)
Bryan Preeshl (Managing Director of QA)
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
< 50 ppm
Mil-Std-105D
MAX1785EUU+
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