W9425G6EH-5 Winbond Electronics, W9425G6EH-5 Datasheet - Page 34
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W9425G6EH-5
Manufacturer Part Number
W9425G6EH-5
Description
IC DDR-400 SDRAM 256MB 66TSSOPII
Manufacturer
Winbond Electronics
Datasheet
1.W9425G6EH-5.pdf
(54 pages)
Specifications of W9425G6EH-5
Format - Memory
RAM
Memory Type
DDR SDRAM
Memory Size
256M (16Mx16)
Speed
250MHz
Interface
Parallel
Voltage - Supply
2.3 V ~ 2.7 V
Operating Temperature
0°C ~ 70°C
Package / Case
66-TSOPII
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
W9425G6EH-5
Manufacturer:
WINBOND
Quantity:
1 728
Part Number:
W9425G6EH-5
Manufacturer:
WINBOND/华邦
Quantity:
20 000
10.9 System Notes:
a. Pullup slew rate is characterized under the test conditions as shown in Figure 1.
b. Pulldown slew rate is measured under the test conditions shown in Figure 2.
c. Pullup slew rate is measured between (V
d. Evaluation conditions
e. The ratio of pullup slew rate to pulldown slew rate is specified for the same temperature and
f. Verified under typical conditions for qualification purposes.
Pulldown slew rate is measured between (V
Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs
switching and only one output switching.
Example: For typical slew rate, DQ0 is switching
Typical:
Minimum:
Maximum:
voltage, over the entire temperature and voltage range. For a given output, it represents the
maximum difference between pullup and pulldown drivers due to process variation.
For minimum slew rate, all DQ bits are switching worst case pattern
For maximum slew rate, only one DQ is switching from either high to low, or low to high
The remaining DQ bits remain the same as for previous state
25
70
0
o
C (T Ambient), V
o
o
C (T Ambient), V
C (T Ambient), V
Output
Figure 1: Pullup slew rate test load
Figure 2: Pulldown slew rate test load
DDQ
DDQ
DDQ
VSSQ
= maximum, fast-fast process
= nominal, typical process
= minimum, slow-slow process
DDQ
DDQ
/2 - 320 mV ± 250 mV)
50 Ω
- 34 -
/2 + 320 mV ± 250 mV)
Test point
Publication Release Date:Dec. 03, 2008
W9425G6EH
Revision A08