TLP627-4 Toshiba, TLP627-4 Datasheet - Page 60

PHOTOCPLR QUAD HS DARL-OUT 16DIP

TLP627-4

Manufacturer Part Number
TLP627-4
Description
PHOTOCPLR QUAD HS DARL-OUT 16DIP
Manufacturer
Toshiba
Datasheets

Specifications of TLP627-4

Number Of Channels
4
Input Type
DC
Voltage - Isolation
5000Vrms
Current Transfer Ratio (min)
1000% @ 1mA
Voltage - Output
300V
Current - Output / Channel
150mA
Current - Dc Forward (if)
50mA
Vce Saturation (max)
1.2V
Output Type
Darlington
Mounting Type
Through Hole
Package / Case
16-DIP (0.300", 7.62mm)
No. Of Channels
4
Isolation Voltage
5kV
Optocoupler Output Type
Photodarlington
Input Current
16mA
Output Voltage
300V
Opto Case Style
DIP
No. Of Pins
16
Approval Bodies
UL
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Current Transfer Ratio (max)
-

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Part Number
Manufacturer
Quantity
Price
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Manufacturer:
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9 215
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Manufacturer:
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Part Number:
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Part Number:
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0
9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are shown as
reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
10000000
1
1
1000000
100000
10000
140
120
100
140
120
100
GaAs LED Projected Light Output Degradation Data
GaAs LED Projected Operating Life Data
1000
Device Degradation
80
60
40
20
80
60
40
20
100
0
0
1
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –50%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
I
F
4.0
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Ambient Temperature (°C)
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
X-3σ
1 / K (x10
X
X
–73
5.0
100000
100000
-3
)
60
10000000
1000000
100000
10000
140
120
100
1000
80
60
40
20
100
0
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
0
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Ambient Temperature (°C)
Projected F50%
operating life
Projected F0.1%
operating life
10000
–50
X-3σ
1 / K (x10
X
–73
5.0
100000
-3
)

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