ADIS16300/PCBZ Analog Devices Inc, ADIS16300/PCBZ Datasheet - Page 14

• Manufacturer Part Number: ADIS16300/PCBZ
• Description: BOARD EVAL ADIS16300
• Manufacturer: Analog Devices Inc
• Type: Accelerometerr

Specifications of ADIS16300/PCBZ

• Contents: Evaluation Board
• For Use With/related Products: ADIS16300
• For Use With: ADISUSBZ - KIT EVAL ADIS W/SOFTWARE USB
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADIS16300
DIAGNOSTICS
Self-Test
Self-test offers the opportunity to verify the mechanical
integrity of each MEMS sensor. It applies an electrostatic force
to each sensor element, which results in mechanical displace-
ment that simulates a response to actual motion. Table 1 lists
the expected response for each sensor, which provides pass/fail
criteria. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the
internal self-test routine, which exercises all inertial sensors,
measures each response, makes pass/fail decisions, and reports
them to error flags in the DIAG_STAT register. MSC_CTRL[10]
resets itself to 0 after completing the routine. MSC_CTRL[9:8]
(DIN = 0xB502 or 0xB501) provides manual control over the
self-test function. Table 20 gives an example test flow for using
this option.
Table 20. Manual Self-Test Example Sequence
DIN
0xB601
0xB904
0xB802
0x0400
0x0600
0x0800
0x0A00
0xB502
0x0400
0xB501
0x0400
0x0600
0x0800
0x0A00
0xB500
Zero motion provides results that are more reliable. The settings
in Table 20 are flexible and provide opportunity for optimization
around speed and noise influence. For example, lowering the
filtering taps enables lower delay times but increases the oppor-
tunity for noise influence.
Memory Test
Setting MSC_CTRL[11] = 1 (DIN = 0xB508) does a check-sum
verification of the flash memory locations. The pass/fail criteria
load into the DIAG_STAT[6] register.
Read XACCL_OUT.
Read XACCL_OUT.
Description
SMPL_PRD[7:0] = 0x01, sample rate = 819.2 SPS.
SENS_AVG[15:8] = 0x04, gyro range = ±300°/sec.
SENS_AVG[7:0] = 0x02, 4-tap averaging filter.
Delay = 50 ms.
Read GYRO_OUT.
Read YACCL_OUT.
Read ZACCL_OUT.
MSC_CTRL[9] = 1, gyroscope negative self-test.
Delay = 50 ms.
Read GYRO_OUT.
Determine whether the bias in the gyroscope
output changes according to the expectation set
in Table 2.
MSC_CTRL[9:8] = 01, gyroscope/accelerometer
positive self-test.
Delay = 50 ms.
Read GYRO_OUT.
Read YACCL_OUT.
Read ZACCL_OUT
Determine whether the bias in the gyroscope and
accelerometers changed according to the expect-
ation set in Table 2.
MSC_CTRL[15:8] = 0x00.
Rev. A | Page 14 of 16
Status
The error flags provide indicator functions for common system
level issues. All of the flags clear (set to 0) after each DIAG_STAT
register read cycle. If an error condition remains, the error flag
returns to 1 during the next sample cycle. DIAG_STAT[1:0]
does not require a read of this register to return to zero. If the
power supply voltage goes back into range, these two flags clear
automatically.
Table 21. DIAG_STAT Bit Descriptions
Bit
[15]
[14]
[13]
[12:11]
[10]
[9]
[8]
[7]
[6]
[5]
[4]
[3]
[2]
[1]
[0]
Alarm Registers
The alarm function provides monitoring for two independent
conditions. The ALM_CTRL register provides control inputs
for data source, data filtering (prior to comparison), static
comparison, dynamic rate-of-change comparison, and output
indicator configurations. The ALM_MAGx registers establish the
trigger threshold and polarity configurations.
Table 25 gives an example of how to configure a static alarm.
The ALM_SMPLx registers provide the numbers of samples to
use in the dynamic rate-of-change configuration. The period
equals the number in the ALM_SMPLx register, multiplied by
the sample period time, established by the SMPL_PRD register.
See Table 26 for an example of how to configure the sensor for
this type of function.
Description
Z-axis accelerometer self-test failure
1 = error condition, 0 = normal operation
Y-axis accelerometer self-test failure
1 = error condition, 0 = normal operation
X-axis accelerometer self-test failure
1 = error condition, 0 = normal operation
Not used
Gyroscope self-test failure
1 = error condition, 0 = normal operation
Alarm 2 status
1 = active, 0 = inactive
Alarm 1 status
1 = active, 0 = inactive
Not used
Flash test, check-sum flag
1 = failure, 0 = normal operation
Self-test diagnostic error flag
1 = error condition, 0 = normal operation
Sensor overrange
1 = error condition, 0 = normal operation
SPI communications failure
1 = error condition, 0 = normal operation
Flash update failed
1 = error condition, 0 = normal operation
Power supply above 5.25 V
1 = power supply ≥ 5.25 V, 0 = power supply ≤ 5.25 V
Power supply below 4.75 V
1 = power supply ≤ 4.75 V, 0 = power supply ≥ 4.75 V