TLP595G Toshiba, TLP595G Datasheet - Page 62
TLP595G
Manufacturer Part Number
TLP595G
Description
PHOTOCOUPLER RELAY SSR 6-DIP
Manufacturer
Toshiba
Series
TLP595Gr
Specifications of TLP595G
Circuit
SPST-NO (1 Form A)
Output Type
AC, DC
On-state Resistance
12 Ohm
Load Current
150mA
Voltage - Input
1.4VDC
Voltage - Load
0 ~ 400 V
Mounting Type
Through Hole
Termination Style
PC Pin
Package / Case
6-DIP (0.300", 7.62mm)
Input Type
DC
Input Voltage (max)
1.7V
Output Voltage (max)
400V
Input Current (max)
30mA
Output Current
150mA
Isolation Voltage
2.5kV
Circuit Arrangement
1 Form B
Package Type
PDIP
Output Device
MOSFET
Pin Count
5
Mounting
Through Hole
Operating Temp Range
-20C to 85C
Operating Temperature Classification
Commercial
Rad Hardened
No
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
TLP595G
Manufacturer:
TOSHIBA
Quantity:
2 200
Company:
Part Number:
TLP595G
Manufacturer:
INFINEON
Quantity:
2 200
Part Number:
TLP595G
Manufacturer:
TOSHIBA/东芝
Quantity:
20 000
9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
3
3
10000000
1000000
GaA As (DH) LED Projected Light Output Degradation Data
GaA As (DH) LED Projected Operating Life Data
140
120
100
140
120
100
Device Degradation
100000
80
60
40
20
80
60
40
20
10000
0
0
1000
1
1
100
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
F
F
F
F
F
150
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
Test conditions: I
Test conditions: I
100
85
3.0
60
100
100
Test time (h)
Test time (h)
F
F
25
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
1000
1000
0
4.0
I
F
Ambient Temperature (°C)
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F50%
operating life
10000
10000
Projected F0.1%
operating life
X-3σ
–50
X-3σ
1 / K(×10
X
X
100000
100000
–73
5.0
−3
)
62
10000000
1000000
140
120
100
100000
80
60
40
20
10000
0
1000
100
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
Test conditions: I
100
85
3.0
60
100
Test time (h)
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
Ambient Temperature (°C)
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
X
1 / K(×10
100000
–73
5.0
−3
)