SAK-TC1796-256F150E BC Infineon Technologies, SAK-TC1796-256F150E BC Datasheet - Page 94

• Manufacturer Part Number: SAK-TC1796-256F150E BC
• Description: IC MCU 32BIT FLASH BGA-416
• Manufacturer: Infineon Technologies
• Series: TC17xxr

Specifications of SAK-TC1796-256F150E BC

• Core Processor: TriCore
• Core Size: 32-Bit
• Speed: 150MHz
• Connectivity: ASC, CAN, EBI/EMI, MLI, MSC, SSC
• Peripherals: DMA, POR, WDT
• Number Of I /o: 123
• Program Memory Size: 2MB (2M x 8)
• Program Memory Type: FLASH
• Ram Size: 256K x 8
• Voltage - Supply (vcc/vdd): 1.42 V ~ 1.58 V
• Data Converters: A/D 44x12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 416-BGA
• Data Bus Width: 32 bit
• Data Ram Size: 256 KB
• Interface Type: 2xASC, 2xSSC, 2xMSC, 2xMLI
• Maximum Clock Frequency: 150 MHz
• Number Of Programmable I/os: 123
• Number Of Timers: 260
• Operating Supply Voltage: 3.3 V
• Maximum Operating Temperature: + 125 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 8 bit, 10 bit, 12 bit, 44 Channel
• Packages: P-BGA-416
• Max Clock Frequency: 150.0 MHz
• Sram (incl. Cache): 256.0 KByte
• Can Nodes: 4
• A / D Input Lines (incl. Fadc): 44
• Program Memory: 2.0 MB
• For Use With: B158-H8537-G2-X-7600IN - KIT STARTER TC179X FAMILY
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: No
• Other names: SAKTC1796256F150EBCT; SP000097527; SP000097528

Table 15
Parameter
Resistance of the
reference voltage
input path
Total capacitance
of the analog
inputs
Switched
capacitance at the
analog voltage
inputs
ON resistance of
the transmission
gates in the
analog voltage
path
ON resistance for
the ADC test (pull-
down for AIN7)
Current through
resistance for the
ADC test (pull-
down for AIN7)
1) Voltage overshoot to 4 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
2) Voltage overshoot to 1.7 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
4) If
5) If a reduced reference voltage in a range of
6) Current peaks of up to 6 mA with a duration of max. 2 ns may occur
7) TUE is tested at
Data Sheet
summary of the pulses does not exceed 1 h.
summary of the pulses does not exceed 1 h.
overshoot).
V
If the reference voltage is reduced with the factor k (k<1), then TUE, DNL, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to
ADC speed and accuracy.
AREF
16)
the
= (
V
16)
DDM
reference
+ 0.05V to
ADC Characteristics (cont’d) (Operating Conditions apply)
V
AREF
Symbol
R
C
C
R
R
I
= 3.3 V,
AIN7T
AREF
AIN
AIN7T
AINTOT
AINSW
V
voltage
DDM
+ 0.07V), then the accuracy of the ADC decreases by 4LSB12.
V
CC
CC
CC
CC 200
CC –
CC –
AGND
V
= 0 V and
Min.
–
–
–
AREF
V
DDM
increases
V
/2 to
DDM
Typ.
1
–
–
1
300
15 rms
94
Values
V
DDM
= 3.3 V
V
DDM
/2 is used, then there are additional decrease in the
is used, then the ADC converter errors increase.
or
Max.
1.5
25
7
1.5
1000
30 peak mA
the
V
Unit Note /
kΩ
pF
pF
kΩ
Ω
DDM
Electrical Parameters
decreases,
Test Condition
500 Ohm
increased for
AN[1:0] used as
reference input
6)9)
9)19)
9)
Test feature
available only for
AIN7
Test feature
available only for
AIN7
9)
9)
V1.0, 2008-04
TC1796
so
9)
that