AGL1000V2-FGG484 Actel, AGL1000V2-FGG484 Datasheet - Page 54

• Manufacturer Part Number: AGL1000V2-FGG484
• Description: FPGA - Field Programmable Gate Array 1M System Gates IGLOO
• Manufacturer: Actel

Specifications of AGL1000V2-FGG484

• Processor Series: AGL1000
• Core: IP Core
• Maximum Operating Frequency: 526.32 MHz, 892.86 MHz
• Number Of Programmable I/os: 300
• Data Ram Size: 147456
• Supply Voltage (max): 1.575 V
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• Development Tools By Supplier: AGL-Icicle-Kit, AGL-Dev-Kit-SCS, Silicon-Explorer II, Silicon-Sculptor 3, SI-EX-TCA, FlashPro 4, FlashPro 3, FlashPro Lite
• Mounting Style: SMD/SMT
• Supply Voltage (min): 1.14 V
• Number Of Gates: 1 M
• Package / Case: FPBGA-484
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

IGLOO DC and Switching Characteristics
2- 40
The length of time an I/O can withstand I
reliability data below is based on a 3.3 V, 12 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 110°C, the short current condition would have to be sustained for more than three
months to cause a reliability concern. The I/O design does not contain any short circuit protection, but
such protection would only be needed in extremely prolonged stress conditions.
Table 2-44 • Duration of Short Circuit Event before Failure
Table 2-45 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
Temperature
–40°C
–20°C
0°C
25°C
70°C
85°C
100°C
110°C
Input Buffer
LVTTL/LVCMOS
LVDS/B-LVDS/M-LVDS/
LVPECL
*
The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the noise is
low, then the rise time and fall time of input buffers can be increased beyond the maximum value. The
longer the rise/fall times, the more susceptible the input signal is to the board noise. Actel recommends
signal integrity evaluation/characterization of the system to ensure that there is no excessive noise
coupling into input signals.
Input Rise/Fall Time
No requirement
No requirement
(min.)
OSH
R ev i sio n 1 8
/I
OSL
events depends on the junction temperature. The
Input Rise/Fall Time
10 ns *
10 ns *
(max.)
Time before Failure
> 20 years
> 20 years
> 20 years
> 20 years
6 months
3 months
5 years
2 years
10 years (100°C)
20 years (110°C)
Reliability