EPM7160SQC160-10N Altera, EPM7160SQC160-10N Datasheet - Page 18

IC PLD EEPROM 160 MACROCELL 10NS QFP-160

EPM7160SQC160-10N

Manufacturer Part Number
EPM7160SQC160-10N
Description
IC PLD EEPROM 160 MACROCELL 10NS QFP-160
Manufacturer
Altera
Series
MAX 7000Sr
Datasheet

Specifications of EPM7160SQC160-10N

Cpld Type
EEPROM
No. Of Macrocells
160
No. Of I/o's
104
Propagation Delay
10ns
Global Clock Setup Time
3.4ns
Frequency
149.3MHz
Supply Voltage Range
4.75V To 5.25V
Family Name
MAX 7000S
Memory Type
EEPROM
# Macrocells
160
Number Of Usable Gates
3200
Frequency (max)
125MHz
Propagation Delay Time
10ns
Number Of Logic Blocks/elements
10
# I/os (max)
104
Operating Supply Voltage (typ)
5V
In System Programmable
Yes
Operating Supply Voltage (min)
4.75V
Operating Supply Voltage (max)
5.25V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
160
Package Type
PQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
EPM7160SQC160-10N
Manufacturer:
Altera
Quantity:
10 000
Part Number:
EPM7160SQC160-10N
Manufacturer:
ALTERA
0
MAX 7000 Programmable Logic Device Family Data Sheet
18
Programming Times
The time required to implement each of the six programming stages can
be broken into the following two elements:
By combining the pulse and shift times for each of the programming
stages, the program or verify time can be derived as a function of the TCK
frequency, the number of devices, and specific target device(s). Because
different ISP-capable devices have a different number of EEPROM cells,
both the total fixed and total variable times are unique for a single device.
Programming a Single MAX 7000S Device
The time required to program a single MAX 7000S device in-system can
be calculated from the following formula:
where: t
The ISP times for a stand-alone verification of a single MAX 7000S device
can be calculated from the following formula:
where: t
t PROG
t
VER
A pulse time to erase, program, or read the EEPROM cells.
A shifting time based on the test clock (TCK) frequency and the
number of TCK cycles to shift instructions, address, and data into the
device.
=
=
t
VPULSE
t
Cycle
f
t
Cycle
TCK
t PPULSE
PROG
PPULSE
VER
VPULSE
PTCK
VTCK
+
+
Cycle
--------------------------------
Cycle
------------------------------- -
= Programming time
= Sum of the fixed times to erase, program, and
= Number of TCK cycles to program a device
= TCK frequency
f
= Verify time
= Sum of the fixed times to verify the EEPROM cells
= Number of TCK cycles to verify a device
TCK
f
TCK
VTCK
verify the EEPROM cells
PTCK
Altera Corporation

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