SL2ICS2001DW/V1D,3 NXP Semiconductors, SL2ICS2001DW/V1D,3 Datasheet - Page 21

• Manufacturer Part Number: SL2ICS2001DW/V1D,3
• Description: IC I-CODE SLI UNCASED FOIL
• Manufacturer: NXP Semiconductors

Specifications of SL2ICS2001DW/V1D,3

• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Philips Semiconductors
Functional Specification
4 INLET/LABEL CHARACTERISATION AND TEST
The parameters recommended to be characterised for the inlet/label are:
To detect damage of EEPROM cells during production of inlets/labels a final test of the EEPROM
after assembly of the inlet/label is recommended. This is necessary to achieve lowest failure rates.
Parameter
Resonant frequency
Threshold value of the field strength for
read single block command
Threshold value of the field strength for
write single block command
Product Specification Rev. 3.1
Symbol
H
H
f
res
write
min
21
Conditions
Resonant frequency @ T
Read single block command OK
Write single block (and verifying read single
block) command OK
Standard Label IC SL2 ICS20
amb
= 22 °C @ H
February 2005
min