AM27C040-150DC AMD (ADVANCED MICRO DEVICES), AM27C040-150DC Datasheet - Page 9

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AM27C040-150DC

Manufacturer Part Number
AM27C040-150DC
Description
Manufacturer
AMD (ADVANCED MICRO DEVICES)
Datasheet

Specifications of AM27C040-150DC

Density
4Mb
Access Time (max)
150ns
Supply Current
40mA
Pin Count
32
Mounting
Through Hole
Operating Temperature Classification
Commercial
Lead Free Status / RoHS Status
Supplier Unconfirmed

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TEST CONDITIONS
SWITCHING TEST WAVEFORM
KEY TO SWITCHING WAVEFORMS
Note:
Diodes are IN3064 or equivalents.
Note: For C
3 V
0 V
Device
Under
Test
WAVEFORM
1.5 V
L
= 30 pF.
Input
Figure 1. Test Setup
C L
Test Points
Don’t Care, Any Change Permitted
6.2 k
Does Not Apply
5.0 V
INPUTS
Output
14971G-5
2.7 k
1.5 V
F I N A L
Am27C040
Note: For C
2.4 V
0.45 V
Changing from H to L
Changing from L to H
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference
levels
Output timing measurement
reference levels
Steady
Center Line is High Impedance State (High Z)
Test Condition
L
Table 1. Test Specifications
= 100 pF.
Input
Changing, State Unknown
2.0 V
0.8 V
OUTPUTS
Test Points
L
1 TTL gate
2.0 V
0.8 V
0.45–2.4
0.8, 2.0
0.8, 2.0
100
All
20
Output
KS000010-PAL
14971G-6
Unit
pF
ns
V
V
V
9

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