SDUS5AB-004G SanDisk, SDUS5AB-004G Datasheet - Page 9

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SDUS5AB-004G

Manufacturer Part Number
SDUS5AB-004G
Description
Manufacturer
SanDisk
Type
Flash Diskr
Datasheet

Specifications of SDUS5AB-004G

Density
4GByte
Operating Supply Voltage (typ)
5V
Operating Temperature (min)
0C
Operating Temperature (max)
70C
Package Type
Not Required
Mounting
Socket
Pin Count
10
Operating Temperature Classification
Commercial
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Programmable
Yes
Lead Free Status / RoHS Status
Compliant
SanDisk uSSD 5000
2.5
2.5.1 MTTF
The reliability figure of merit most often used for electronic equipment is Mean
Time To Failure (MTTF). SanDisk estimates MTTF using a prediction
methodology based on reliability data for the individual components in
SanDisk products.
Component data comes from several sources: device life tests, failure analysis
of earlier equipment, device physics, and field returns.
SanDisk uses following methods to predict reliability:
Table
configurations. The analysis was performed using a RAM Commander™ failure
rate prediction.
© 2007 SanDisk® Corporation
Telcordia Special Report SR-332, Reliability Prediction Procedure for
Electronic Equipment (RPP).
British Telecom Industry HRD5, Handbook of Reliability Data for
Electronic Components used in Telecommunication System.
Failure Rate: The total number of failures within an item population,
divided by the total number of life units expended by that population,
during a particular measurement interval under stated condition.
Mean Time To Failures (MTTF): A basic measure of reliability for
repairable items: The mean number of life units during which all parts of
the item perform within their specified limits, during a particular
measurement interval under stated conditions.
6
System Reliability
1GB, 2GB, 4GB
8GB
Specification
Data Reliability
Data integrity after power loss
Bad blocks
Wear-leveling
summarizes
Product
the
Table 6: uSSD MTTF
Table 5: Reliability
MTTF
Telcordia SR-332, GB, 25°C
Telcordia SR-332, GB, 25°C
8
Parameters
Error detection / error correction based on
BCH algorithm
Data is guaranteed after power loss
Transparent bad block management
Dynamic and Static Wear-leveling
prediction
Condition
results
MTTF (Hours)
for
4M
3M
various
Product Manual
August 2007
uSSD

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