5962-8996702MXA QP SEMICONDUCTOR, 5962-8996702MXA Datasheet - Page 15

• Manufacturer Part Number: 5962-8996702MXA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8996702MXA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Delta limits shall apply only to subgroup 1 of group C inspection and shall consist of tests specified in table IIB herein.
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-
883.
(see 3.5 herein).
made available upon request.
before and after the required burn-in screens and steady-state life tests to determine delta compliance. The electrical
parameters to be measured, with associated delta limits are listed in table IIB. The device manufacturer may, at his option,
either perform delta measurements or within 24 hours after burn-in perform final electrical parameter tests, subgroups 1, 7,
and 9.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
4.5 Programming procedure. The programming procedures shall be as specified by the device manufacturer and shall be
4.6 Delta measurements for device class V. Delta measurements, as specified in table IIA, shall be made and recorded
a.
b.
c.
a.
b.
Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
End-point electrical parameters shall be as specified in table IIA herein.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
T
DEFENSE SUPPLY CENTER COLUMBUS
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005.
A
A
= +125°C, minimum.
= +25°C ± 5°C, after exposure, to the subgroups specified in table IIA herein.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
1/ The above parameter shall be recorded before and after the required
burn-in and life tests to determine the delta.
Test 1/
Table IIB. Delta limits at +25°C.
I
I
OZ
IX
+10% of specified value in table I
+10% of specified value in table I
SIZE
A
Device types
All
REVISION LEVEL
A
SHEET
5962-89967
15