57C51C-55TI STMicroelectronics, 57C51C-55TI Datasheet - Page 4

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57C51C-55TI

Manufacturer Part Number
57C51C-55TI
Description
Manufacturer
STMicroelectronics
Datasheet

Specifications of 57C51C-55TI

Density
128Kb
Organization
16Kx8
Access Time (max)
55ns
Operating Current
60mA
Interface Type
Parallel
Package Type
CDIP
Operating Temperature Classification
Industrial
Operating Supply Voltage (typ)
5V
Operating Temp Range
-40C to 85C
Pin Count
28
Mounting
Through Hole
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Lead Free Status / RoHS Status
Supplier Unconfirmed

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Part Number
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Quantity
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12
CAPACITANCE
WS57C51C
NOTES: 4. This parameter is only sampled and is not 100% tested.
TEST LOAD
2-50
NOTE: 6. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
2.01 V
D.U.T.
SYMBOL
C
C
C
IN
OUT
VPP
5.Typical values are for T
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between V
Inadequate decoupling may result in access time degradation or other transient performance failures.
(High Impedance Test Systems)
98
(4)
Input Capacitance
Output Capacitance
V
PP
T
PARAMETER
A
Capacitance
= 25°C, f = 1 MHz
A
= 25°C and nominal supply voltages.
30 pF
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
CONDITIONS
V
V
V
OUT
PP
IN
= 0 V
= 0V
= 0V
A.C. TESTING INPUT/OUTPUT WAVEFORM
A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V
for a logic "0." Timing measurements are made at 1.5 V for
input and output transitions in both directions.
3.0
0.0
TYP
18
4
8
1.5
(5)
CC
POINTS
TEST
and ground is recommended.
MAX
12
25
6
1.5
UNITS
pF
pF
pF

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