5962-88734043A E2V, 5962-88734043A Datasheet - Page 10

• Manufacturer Part Number: 5962-88734043A
• Manufacturer: E2V

Specifications of 5962-88734043A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
a.
b.
c.
d.
e.
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input or output capacitance. Sample size is 15 devices with no failures, and all input and
output terminals tested.
Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
group A, subgroups 9, 10, and 11. Either of two techniques is acceptable:
Subgroups 7 and 8 shall include verification of the truth table.
(1) Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify
(2) If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
programmability and ac performance without programming the user array. If this is done, the resulting test
patterns shall be verified on all devices during subgroups 9, 10, and 11, group A testing in accordance with the
sampling plan specified in MIL-STD-883, method 5005.
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 4.4). If more than two devices fail to program, the lot shall be rejected. At the manufacturer's
option, the sample may be increased to 24 total devices with no more than four total device failures allowable.
Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9,
10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may
be increased to 20 total devices with no more than four total device failures allowable.
STANDARD
IN
and C
1/ Any subgroups at the same temperature may be combined when using a
*
**
Interim electrical parameters
Final electrical test parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point electrical
parameters (method 5005)
multifunction tester.
(method 5004)
(method 5004) for unprogrammed
devices
(method 5004) for programmed
devices
(method 5005)
OUT
MIL-STD-883 test requirements
PDA applies to subgroup 1 and 7.
See 4.3.1c.
measurements) shall be measured only for the initial test and after process or design
TABLE II. Electrical test requirements. 1/
SIZE
A
1*, 2, 3, 7*, 8
1*, 2, 3, 7*, 8, 9
1, 2, 3, 4**, 7, 8, 9, 10, 11
MIL-STD-883, method 5005,
2, 3, 7, 8
(in accordance with
Subgroups
REVISION LEVEL
table I)
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C
SHEET
5962-88734
10