5962-88735033A E2V, 5962-88735033A Datasheet - Page 4

• Manufacturer Part Number: 5962-88735033A
• Manufacturer: E2V

Specifications of 5962-88735033A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For
packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the
option of not marking the "5962-" on the device.
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
manufacturer or the user to result in a wide variety of PROM configurations, two processing options are provided for selection
in the contract using an altered item drawing.
is recommended that users perform subgroups 7 and 9 after programming to verify the specific program configuration.
herein, including the requirements of the altered item drawing shall be satisfied by the manufacturer prior to delivery.
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
with each lot of microcircuits delivered to this drawing.
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
prior to quality conformance inspection. The following additional criteria shall apply:
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
3.9 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.10 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
3.6 Processing options. Since the PROM is an unprogrammed memory capable of being programmed by either the
3.6.1 Unprogrammed PROM delivered to the user. All testing shall be verified through group A testing as defined in 4.3.1. It
3.6.2 Manufacturer-programmed PROM delivered to the user. All testing requirements and quality assurance provisions
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
a. Burn-in test (method 1015 of MIL-STD-883).
(1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
a.
b.
c.
tests prior to burn-in are optional at the discretion of the manufacturer.
DEFENSE SUPPLY CENTER COLUMBUS
and shall be made available to the preparing or procuring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of
MIL-STD-883.
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input or output capacitance. Sample size is 15 devices with no failures, and all input and
output terminals tested.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
IN
and C
OUT
measurements) shall be measured only for the initial test and after process or design
SIZE
A
REVISION LEVEL
E
SHEET
5962-88735
4