CY7C373I-83JC Cypress Semiconductor Corp, CY7C373I-83JC Datasheet - Page 4

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CY7C373I-83JC

Manufacturer Part Number
CY7C373I-83JC
Description
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY7C373I-83JC

Family Name
FLASH370i
# Macrocells
64
Number Of Usable Gates
1600
Propagation Delay Time
15ns
Number Of Logic Blocks/elements
4
# I/os (max)
64
Operating Supply Voltage (typ)
5V
In System Programmable
Yes
Operating Supply Voltage (min)
4.75V
Operating Supply Voltage (max)
5.25V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
84
Package Type
PLCC
Memory Type
Flash
Lead Free Status / RoHS Status
Not Compliant
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ...................................–65°C to +150°C
Ambient Temperature with
Power Applied...............................................–55°C to +125°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ............................................... –0.5V to +7.0V
DC Input Voltage............................................ –0.5V to +7.0V
DC Program Voltage .....................................................12.5V
Output Current into Outputs.........................................16 mA
Electrical Characteristics
Document #: 38-03030 Rev. *A
V
V
V
V
V
I
I
I
I
I
I
I
I
Notes:
Parameter
IX
OZ
OS
CC
BHL
BHH
BHLO
BHHO
2. If V
3. I
4. When the I/O is three-stated, the bus-hold circuit can weakly pull the I/O to a maximum of 4.0V if no leakage current is allowed. This voltage is lowered significantly
5. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
6. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. V
OH
OHZ
OL
IH
IL
by a small leakage current. Note that all I/Os are three-stated during ISR programming. Refer to the application note “Understanding Bus Hold” for additional
information.
caused by tester ground degradation.
OH
CCIO
= –2 mA, I
is not specified, the device can be operating in either 3.3V or 5V I/O mode; V
Output HIGH Voltage
Output HIGH Voltage
with Output Disabled
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Leakage Current V
Output Short
Circuit Current
Power Supply Current
Input Bus Hold LOW
Sustaining Current
Input Bus Hold HIGH
Sustaining Current
Input Bus Hold LOW
Overdrive Current
Input Bus Hold HIGH
Overdrive Current
OL
= 2 mA for SDO.
Description
[6, 7]
Over the Operating Range
[7]
[8]
V
V
V
Guaranteed Input Logical HIGH Voltage for all Inputs
Guaranteed Input Logical LOW Voltage for all Inputs
V
V
V
V
f = 1 MHz, V
V
V
V
V
CC
CC
CC
I
CC
CC
CC
CC
CC
CC
CC
CC
= Internal GND, V
USE ULTRA37000
= Min.
= Min.
= Max., V
= Max., I
= Min., V
= Min., V
= Max.
= Max.
= Max.
= Max., V
= Max., V
ALL NEW DESIGNS
IN
OUT
IL
IH
OUT
= GND, V
I
I
I
I
O
O
= 0.8V
OH
OH
OH
OL
= 2.0V
= GND or V
= 3.3V, Output Disabled
= 0 mA,
= 0.5V
= 16 mA (Com’l/Ind)
= –3.2 mA (Com’l/Ind)
= 0 µA (Com’l/Ind)
= –50 µA (Com’l/Ind)
I
Test Conditions
= V
[2]
CC
CC
Static Discharge Voltage............................................ >2001V
(per MIL–STD–883, Method 3015)
Latch-Up Current..................................................... >200 mA
Operating Range
Commercial
Industrial
O
Range
= V
CC
=V
TM
CC
CCINT
, Output Disabled
FOR
[3]
[3, 4]
[3]
.
Com’l/Ind.
Com’l “L”, –66
[3, 4]
[4]
−40°C to +85°C
Temperature
0°C to +70°C
Ambient
OUT
[5]
[5]
= 0.5V has been chosen to avoid test problems
Min.
–0.5
–10
–50
–30
+75
–75
2.4
2.0
0
5V ± 0.25V
5V ± 0.5V
V
V
CCINT
Typ.
–70
CC
75
45
CY7C373i
Max.
–125
–160
+500
–500
+10
+50
125
4.0
3.6
0.5
7.0
0.8
Page 4 of 12
3.3V ± 0.3V
3.3V ± 0.3V
75
5V ± 0.25V
5V ± 0.5V
V
OR
OR
CCIO
Unit
mA
mA
mA
µA
µA
µA
µA
µA
µA
µA
V
V
V
V
V
V
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