5962-8946805XC E2V, 5962-8946805XC Datasheet - Page 17

• Manufacturer Part Number: 5962-8946805XC
• Manufacturer: E2V

Specifications of 5962-8946805XC

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
reprogrammability test shall be done only for initial characterization and after any design or process changes which may affect
the reprogrammability of the device. The methods and procedures may be vendor specific, but will guarantee the number of
program/erase endurance cycles listed in section 1.3 herein. The vendor's procedure shall be under document control and
shall be made available upon request.
be done initially and after any design or process change which may affect data retention. The methods and procedures may be
vendor specific, but will guarantee the number of years listed in section 1.3 herein. The vendors procedure shall be under
document control and shall be made available upon request. Data retention capability shall be guaranteed over the full military
temperature range.
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
manufacturer prior to delivery.
specified in 4.4.
procedures and characteristics specified in 4.5.
(see 4.5 herein) to the specified pattern or erased (see 4.4 herein). As a minimum, verification shall consist of performing a
functional test (subgroup 7) to verify that all bits are in the proper state. Any bit that does not verify to be in the proper state
shall constitute a device failure, and shall be removed from the lot.
appendix A.
devices prior to quality conformance inspection. The following additional criteria shall apply:
STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
3.10 Processing EPLD's. All testing requirements and quality assurance provisions herein shall be satisfied by the
3.10.1 Erasure of EPLD's. When specified, devices shall be erased in accordance with the procedures and characteristics
3.10.2 Programmability of EPLD's. When specified, devices shall be programmed to the specified pattern using the
3.10.3 Verification of erasure or programmed EPLD's. When specified, devices shall be verified as either programmed
3.11 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitor. This
3.12 Data retention. A data retention stress test shall be completed as part of the vendor's reliability process. This test shall
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
a. Prior to burn-in, the devices shall be programmed (see 4.7 herein) with a checkerboard pattern or equivalent
b. Burn-in test, method 1015 of MIL-STD-883.
c. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
(1)
(manufacturers at their option may employ an equivalent pattern provided it is a topologically true alternating bit
pattern). The pattern shall be read before and after burn-in. Devices having bits not in the proper state after burn-in
shall constitute a device failure and shall be included in the Percent Defective Allowable (PDA) calculation and shall
be removed from the lot. The manufacturer as an option may use built-in test circuitry by testing the entire lot to verify
programmability and AC performance without programming the user array.
tests prior to burn-in are optional at the discretion of the manufacturer.
DEFENSE SUPPLY CENTER COLUMBUS
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of
MIL-STD-883.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
C
SHEET
5962-89468
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