5962-8753904LA QP SEMICONDUCTOR, 5962-8753904LA Datasheet - Page 4

• Manufacturer Part Number: 5962-8753904LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8753904LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
tests for each subgroup are described in table I.
in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN
number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
with each lot of microcircuits delivered to this drawing.
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
a wide variety of configurations; two processing options are provided for selection in the contract.
and table II. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program
configuration.
herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to delivery.
manufacturer prior to delivery.
specified in 4.4.
procedures and characteristics specified in 4.5.
4.5 herein) to the specified pattern or erased (see 4.4 herein). As a minimum, verification shall consist of performing a
functional test (subgroup 7) to verify that all bits are in the proper state. Any bit that does not verify to be in the proper state
shall constitute a device failure, and shall be removed from the lot.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.9 Verification and review. Defense Supply Center Columbus (DSCC), DSCC's agent, and the acquiring activity retain the
3.10 Processing options. Since the device is capable of being programmed by either the manufacturer or the user to result in
3.10.1 Unprogrammed device delivered to the user. All testing shall be verified through group A testing as defined in 3.2.3.1
3.10.2 Manufacturer programmed device delivered to the user. All testing requirements and quality assurance provisions
3.11 Processing EPLDS. All testing requirements and quality assurance provisions herein shall be satisfied by the
3.11.1 Erasure of EPLDS. When specified, devices shall be erased in accordance with the procedures and characteristics
3.11.2 Programmability of EPLDS. When specified, devices shall be programmed to the specified pattern using the
3.11.3 Verification of erasure or programmed EPLD's. When specified, devices shall be verified as either programmed (see
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
L
SHEET
5962-87539
4