M38510/20602BVA E2V, M38510/20602BVA Datasheet
M38510/20602BVA
Specifications of M38510/20602BVA
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M38510/20602BVA Summary of contents
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MICROCIRCUIT, DIGITAL, 4096-BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), This specification is approved for use by all Departments The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535. 1. SCOPE 1.1 Scope. This specification ...
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Absolute maximum ratings. Supply voltage range ............................................................................. -0 +7 Input voltage range ................................................................................ - Storage temperature range .................................................................... -65° to +150°C Lead temperature (soldering, 10 ...
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Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this specification ...
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TABLE I Test High-level output voltage Low-level output voltage Input clamp voltage Maximum collector cut-off current High-impedence (off-state) output high current High-impedence (off-state) output low current High level input current High level input current Low level input current Short circuit ...
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MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters for unprogrammed devices Final electrical test parameters for programmed devices Group A test requirements Group B end-point electrical parameters subgroup 5 Group C end-point electrical parameters Group D test requirements ...
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NOTES: 1. Index area: A notch, indentification mark or elongation shall be used to identify pin 1. 2. Applies to all four corners. Corners may also be chamfered. 3. Shaded areas are metallized Locations organic or ...
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NOTES: 1. Index area; a notch or a pin one identification mark shall be located adjacent to pin one and shall be within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark. ...
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MIL-M-38510/206D Device type 01, 02, and 04 Cases Pin V, Z, and U Y number ...
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Word Enable no NOTES Not applicable Input may ...
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MIL-M-38510/206D FIGURE 4. Functional block diagram. 10 ...
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MIL-M-38510/206D FIGURE 4. Functional block diagram – Continued. 11 ...
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MIL-M-38510/206D FIGURE 4. Functional block diagram – Continued. 12 ...
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MIL-M-38510/206D FIGURE 4. Functional block diagram - Continued 13 ...
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MIL-M-38510/206D FIGURE 4. Functional block diagram - Continued 14 ...
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MIL-M-38510/206D FIGURE 4. Functional block diagram – Continued. 15 ...
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NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...
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NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...
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NOTE: All other waveform characteristics shall be as specified in table IVA. FIGURE 6A. Programming voltage waveforms during programming for circuit A. MIL-M-38510/206D 18 ...
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FIGURE 6B. Typical programming voltage waveforms during programming for circuit B. NOTE: All other waveform characteristics shall be as specified in table IV C. FIGURE 6C. Typical programming voltage waveforms during programming for circuit C. MIL-M-38510/206D 19 ...
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MIL-M-38510/206D FIGURE 6D Programming voltage waveforms during programming for circuit D. FIGURE 6G. Programming voltage waveforms during programming for circuit G. 20 ...
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NOTES: = 4.7Ω ±5%. All bit outputs shall have separate identical loads All Addresses inputs shall be either high, low, or open kΩ ±5 Burn-in circuit may be used to ...
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VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF- 38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, ...
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Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-38535 and as specified herein for groups and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in ...
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Programming procedure for circuit A. The programming characteristics in table IVA and the following procedures shall be used for programming the device. a. Connect the device in the electrical configuration for programming. The waveforms on figure 6A and the ...
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Subgroup Symbol MIL-STD- Case 883 Case method Test No - 25° ...
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Subgroup Symbol MIL-STD- Case 883 Case method Test No Same tests, terminal conditions, and limits as subgroup 7, except GALPAT ...
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Subgroup Symbol MIL-STD- Case 883 Case method Test 25° - ...
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Subgroup Symbol MIL-STD- Case 883 Case method Test No 3011 54 9/, 12/ 9/, 10/ 9/, 12 “ “ 11 25°C ...
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Subgroup Symbol MIL-STD- Case 883 Test No method - - +25° - ...
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Subgroup Symbol MIL-STD- Case 883 Test No method 8 Same tests, terminal conditions and limits as for subgroup 7, except See PLH1 Fig 5 T ...
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The functional tests shall verify that no fuses are blown for unprogrammed devices or that the truth table specified in the altered item drawing exists for programmed devices (see 3.3.2). All bits shall be tested. Terminal conditions shall be ...
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For uprogrammed devices, apply 10 11/ For unprogrammed devices, apply this pin for circuit G devices. 12/ For unprogrammed devices, apply this pin for circuit G devices. 13/ At the ...
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TABLE IVA. Programming characteristics for circuit A. Parameter Symbol Address input voltage Programing V PH Voltage to V low Program verify V PHV Verify voltage V R Programming input low I ILP current ...
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TABLE IVB. Programming characteristics for circuit B. Parameter Symbol V required during V CC CCP programming V current limit I OUT OP during programming Output programming V OUT voltage Pulse width of t programming voltage Programming delay ...
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TABLE IVC. Programming characteristics for circuit C. Parameter Symbol Programming voltage V CCP 1/ Verificaiton upper limit V CCH Verificaiton lower limit V CCL Verify threshold V S Programming supply I CCP current Input voltage high level V “1” Input ...
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TABLE IVD. Programming characteristics for circuit D. Parameter Symbol V required during V CC CCP programming Verification V read V CC CCL Input voltage high level V “1” Input voltage low level “0” V Chip enable CE1, CE2 Output programming ...
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To verify programming, lower inputs. The programmed outputs should remain in the high state and the unprogrammed IL 1 outputs should go to the low level any bit does not verify as programmed, ...
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Enable the chip by applying any bit does not verify as programmed, it shall be considered a programming reject. 4.11 Programming procedure for circuit G. The programming characteristics on table IVG and the following procedures shall ...
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TABLE IVG. Programming characteristics for circuit G. Parameter Symbol V required during V CC CCP programming I during programming I CC CCP Required output voltage V for programming Output current while I OP programming Rate of voltage change of I ...
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Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. PIN and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the conformance inspection data pertinent to ...
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Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or ...