E629AXF Semtech, E629AXF Datasheet

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E629AXF

Manufacturer Part Number
E629AXF
Description
Manufacturer
Semtech
Datasheet

Specifications of E629AXF

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Part Number
Manufacturer
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Price
Part Number:
E629AXF
Manufacturer:
SEMTECH/美国升特
Quantity:
20 000
Revision 3 / August 1, 2005
The Edge629 is a monolithic timing delay and signal fanout
solution manufactured in a high-performance bipolar pro-
cess. In Automatic Test Equipment (ATE) applications, the
Edge629 buffers, distributes, and aligns timing signals
across multiple channels (typically found inside Memory
Test Systems). It is also suitable for per pin deskew in
Logic Testers.
The Edge629 supports:
• Minimum pulse width = 330 ps with Falling
• Net usable delay span
• Falling Edge Adjust
• On Board DACs to generate 5 ps resolution
With a maximum operating frequency of 1 GHz, the
Edge629 is optimized for extremely high speed, high ac-
curacy testers, particularly those aimed to test memory
devices.
The Edge629 solves several difficult problems associated
with aligning multiple timing signals because it can:
• delay very narrow pulses over a long
• adjust the falling edge independently from the overall
• maintain extreme timing accuracy for very narrow
• maintain tight timing accuracy over changes in
• Memory Test Equipment
• Logic Testers
• Clock / Signal Fanout
TEST AND MEASUREMENT PRODUCTS
Description
Applications
Edge Adjust disabled, 500 ps with Falling
Edge Adjust enabled
timing span
propagation delay
(sub-ns) pulses
frequency, duty cycle, and pattern.
– Data Fanout
– Channel Deskew
– Per Pin Deskew
250 ps
4.0 ns
1
• Fmax
• Independent Falling Edge Adjust
• Small Footprint (10 mm x 10 mm)
• Excellent Timing Accuracy
• Very Stable Timing Delays
• 5 ps Resolution
• ECL, CMOS Compatible Inputs
Featur es
Functional Block Diagram
SEL / SEL*
IN0 / IN0*
IN2 / IN2*
IN3 / IN3*
IN1/ IN1*
IN / IN*
1 GHz Timing Deskew and Quad
1 GHz
T–
T–
T–
T–
Coarse
Coarse
Coarse
Coarse
T
T
T
T
Fanout Element
Edge629
Fine
Fine
Fine
Fine
T
T
T
T
www .semtech.com
OUT0 / OUT0*
OUT1 / OUT1*
OUT2 / OUT2*
OUT3 / OUT3*

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E629AXF Summary of contents

Page 1

... Functional Block Diagram IN0 / IN0* T– IN* IN1/ IN1* T– IN2 / IN2* T– IN3 / IN3* T– SEL / SEL* 1 Edge629 Fanout Element T T OUT0 / OUT0* Coarse Fine T T OUT1 / OUT1* Coarse Fine T T OUT2 / OUT2* Coarse Fine OUT3 / OUT3 Coarse Fine www .semtech.com ...

Page 2

... TEST AND MEASUREMENT PRODUCTS PIN Description 2005 Semtech Corp. Rev. 3, 8/1/ Edge629 www.semtech.com ...

Page 3

... IN3* IN3 VCC3 VCC2 IN2* IN2 VEE2 IN* IN VEE1 IN1 IN1* VCC1 VCC0 IN0 IN0* 17 2005 Semtech Corp. Rev. 3, 8/1/05 E629AXF 64 Pin TQFP Top View 3 Edge629 49 OUT3 OUT3* VCC3 VCC2 OUT2 OUT2* VEE2 VEE4 VCC4 VEE1 OUT1* OUT1 VCC1 VCC0 ...

Page 4

... Semtech Corp. Rev. 3, 8/1/05 Coarse Delay Coarse propagation delay adjustment is accomplished using a series of gate delays and multiplexers (see Fig- ure 1). Coarse delay provides a total delay span of: ...

Page 5

... Semtech Corp. Rev. 3, 8/1/05 Fine Delay Select The fine delay section may be selected or bypassed by a multiplexer (see Figure 2). If SFD (Select Fine Delay) is high, Fine Delay will be used ...

Page 6

... Bit DAC T Figure 3. Falling Edge Adjust Architecture 2005 Semtech Corp. Rev. 3, 8/1/05 There is a limitation on FEA range vs. pulse width. Falling Edge Adjust DAC Outputs DAC_FALL_(0–3) are analog voltage outputs from the on- board DACs which program the falling edge delay elements ...

Page 7

... Bits 0–6 are used for data, bits 11–15 for address. Bits 11–14 select destinations, bit 15, if high, selects all 16 locations to be loaded simultaneously (use- ful for preloading all registers to a default state). Figure 5. Voltage vs. Temperature for Thermal Diode String 2005 Semtech Corp. Rev. 3, 8/1/ ...

Page 8

... CD0 CD1 CD2 CD3 CD4 FD0 FD1 FD2 FD3 FD4 SDI SDI FE0 FE1 FE2 FE3 FE4 CS UPDATE 2005 Semtech Corp. Rev. 3, 8/1/05 629 Digital Interface Timing 16 Bit Loads CD5 FD5 SFD FE5 FE6 SFE Figure 6. Synchronous Loading 8 Edge629 CK15 ... ...

Page 9

... TEST AND MEASUREMENT PRODUCTS Circuit Description (continued Channel Channel Channel Channel 3 E UPDATE CS CK SDI 2005 Semtech Corp. Rev. 3, 8/1/ Address Figure 7. Data Interface 9 Edge629 Coarse Delay MSB Fine Delay SFD MSB Falling Edge Adjust MSB SFE Coarse Delay MSB Fine Delay ...

Page 10

... SEL/SEL* have internal pull-up/pull-down resistors which, when left floating, place the chip in fanout mode. VCC SEL* SEL 2005 Semtech Corp. Rev. 3, 8/1/05 Data Interface Digital Inputs All data digital inputs are standard, single ended ECL in- puts with V inputs may receive input signals anywhere between VCC and VEE ...

Page 11

... All dimensions in millimeters. 2. Dimensions shown are nominal with tolerances as indicated. 3. L/F: EFTEC 64T copper or equivalent, 0.127mm (.005”) or 0.15mm (.006”) thick. 4. Foot length “L” is measured at gage plane, at 0.25 above the seating plane. 2005 Semtech Corp. Rev. 3, 8/1/05 64-Pin TQFP 1 – ...

Page 12

... Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these, or any other conditions beyond those listed, is not implied. Exposure to absolute maximum conditions for extended periods may affect device reliability. 2005 Semtech Corp. Rev. 3, 8/1/ ...

Page 13

... TEST AND MEASUREMENT PRODUCTS DC Characteristics – – – – 2005 Semtech Corp. Rev. 3, 8/1/ – – – – – Edge629 – – – – – – – – – – – – www.semtech.com µ A µ µ A µ µ A µ ...

Page 14

... TEST AND MEASUREMENT PRODUCTS AC Characteristics & & & & & & Test Conditions (unless otherwise specified): "Recommended Operating Conditions." 2005 Semtech Corp. Rev. 3, 8/1/ – – Edge629 ± ± ± www.semtech.com ˚ ˚ ˚ ˚ ˚ ˚ ...

Page 15

... SFD=1), and then with the fine delays as separate searches Test Conditions (unless otherwise specified): "Recommended Operating Conditions." AC Characteristics are guaranteed by design and characterization. Not production tested. 2005 Semtech Corp. Rev. 3, 8/1/ Edge629 µ www.semtech.com ...

Page 16

... TEST AND MEASUREMENT PRODUCTS Ordering Infor mation Contact Infor mation 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 2005 Semtech Corp. Rev. 3, 8/1/ Semtech Corporation Test and Measurement Division 16 Edge629 www.semtech.com ...

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