FIN3385MTDX Fairchild Semiconductor, FIN3385MTDX Datasheet - Page 18

IC SERIALIZER/DESERIAL 56-TSSOP

FIN3385MTDX

Manufacturer Part Number
FIN3385MTDX
Description
IC SERIALIZER/DESERIAL 56-TSSOP
Manufacturer
Fairchild Semiconductor
Type
Low Voltage 28-Bit Flat Panel Display Linkr
Datasheet

Specifications of FIN3385MTDX

Function
Serializer/Deserializer
Data Rate
2.38Gbps
Input Type
LVTTL
Output Type
LVDS
Number Of Inputs
28
Number Of Outputs
4
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
-10°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
56-TSSOP
Ic Output Type
LVDS
No. Of Inputs
28
No. Of Outputs
4
Supply Voltage Range
3V To 3.6V
Driver Case Style
TSSOP
No. Of Pins
56
Termination Type
SMD
Rohs Compliant
Yes
Number Of Drivers
4
Number Of Receivers
28
Operating Supply Voltage
3.3 V
Maximum Operating Temperature
+ 150 C
Minimum Operating Temperature
- 65 C
Mounting Style
SMD/SMT
Supply Current
41.8 mA
Supply Voltage (max)
3.6 V
Supply Voltage (min)
3 V
Filter Terminals
SMD
Digital Ic Case Style
TSSOP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FIN3385MTDX
FIN3385MTDXTR
© 2003 Fairchild Semiconductor Corporation
FIN3383/3384/3385/3386 • Rev. 1.0.4
AC Loadings and Waveforms
Note:
Note:
26. Test setup used considers no requirement for separation of RMS and deterministic jitter. Other hardware
27. This jitter pattern is used to test the jitter response (clock out) of the device over the power supply range with
28. Switching input data TxIn0 to TxIn20 at 0.5MHz and the input clock is shifted to left -3ns and to
29. The ±3ns cycle-to-cycle input jitter is the static phase error between the two clock sources. Jumping between
setup, such as Wavecrest boxes, can be used if no M1 software is available, but the test methodology in
Figure 24 should be followed.
worst jitter ±3ns (cycle-to-cycle) clock input. The specific test methodology is as follows:
the right +3ns when data is HIGH.
two clock sources to simulate the worst-case of clock-edge jump (3ns) from graphical controllers. Cycle-to-
cycle jitter at TxCLKOut pin should be measured cross V
<2MHz).
Figure 24. Timing Diagram of Transmitter Clock Input with Jitter
Figure 23. Transmitter Clock Out Jitter Measurement Setup
(Continued)
18
CC
range with 100mV noise (V
CC
noise frequency
www.fairchildsemi.com

Related parts for FIN3385MTDX