MC10114L ON Semiconductor, MC10114L Datasheet - Page 4
MC10114L
Manufacturer Part Number
MC10114L
Description
Manufacturer
ON Semiconductor
Datasheet
1.MC10114L.pdf
(8 pages)
Specifications of MC10114L
Number Of Receivers
3
Number Of Transmitters
Not Required
Number Of Transceivers
Not Required
Receiver Signal Type
Differential
Transmitter Signal Type
Not Required
Supply Current
8mA
Mounting
Through Hole
Pin Count
16
Package Type
CDIP
Lead Free Status / Rohs Status
Not Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MC10114L
Manufacturer:
MOTOROLA
Quantity:
21
Company:
Part Number:
MC10114L
Manufacturer:
MOT
Quantity:
5 510
Company:
Part Number:
MC10114L
Manufacturer:
MOT
Quantity:
5 510
Part Number:
MC10114L
Manufacturer:
MOTOROLA/摩托罗拉
Quantity:
20 000
Company:
Part Number:
MC10114LDS
Manufacturer:
MOT
Quantity:
5 510
Company:
Part Number:
MC10114LDS
Manufacturer:
NEC
Quantity:
5 510
* V
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50-ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
ELECTRICAL CHARACTERISTICS
Power Supply Drain Current
Input Current
Output Voltage
Output Voltage
Threshold Voltage
Threshold Voltage
Reference Voltage
Common Mode Rejection Test
Switching Times
Propagation Delay
Rise Time
Fall Time
V
V
V
IHH
ILH
IHL
ILL
= Input Logic 1 level shifted positive one volt for common mode rejection tests
= Input Logic 0 level shifted positive one volt for common mode rejection tests
= Input Logic 1 level shifted negative one volt for common mode rejection tests
= Input Logic 0 level shifted negative one volt for common mode rejection tests
Characteristic
(20 to 80%)
(20 to 80%)
(50 Load)
Logic 1
Logic 0
Logic 1
Logic 0
@ Test Temperature
Symbol
(continued)
V
V
t
t
t
t
V
V
V
V
V
I
4+2+
4–2–
4+3–
4–3+
I
t
t
t
t
OHA
inH
OLA
I
inL
2+
3+
2–
3–
OH
BB
OH
OL
OL
E
Under
Under
Test
–30 C
+25 C
+85 C
Pin
11
8
4
4
2
3
2
3
2
3
2
3
2
3
2
3
2
2
3
3
2
3
2
3
http://onsemi.com
MC10114
+0.190
+0.300
+0.110
V
V
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
IHH
IHH
4
4
4
*
*
TEST VOLTAGE VALUES (Volts)
–0.890
–0.850
–0.825
V
V
ILH
ILH
5
5
*
*
–1.890
–1.810
–1.700
V
V
IHL
IHL
5
5
*
*
–2.890
–2.850
–2.825
V
V
ILL
ILL
4
4
*
*
–3.2 V
–5.2
–5.2
–5.2
V
V
8, 4
EE
EE
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
+2.0 V
(V
(V
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
Gnd
CC
)
)