IDT74FCT2543ATQ IDT, Integrated Device Technology Inc, IDT74FCT2543ATQ Datasheet - Page 2

• Manufacturer Part Number: IDT74FCT2543ATQ
• Manufacturer: IDT, Integrated Device Technology Inc

Specifications of IDT74FCT2543ATQ

• Logic Family: FCT
• Operating Supply Voltage (typ): 5V
• Propagation Delay Time: 9ns
• Number Of Elements: 1
• Number Of Channels: 8
• Input Logic Level: TTL
• Output Logic Level: TTL
• Output Type: 3-State
• Package Type: QSOP
• Polarity: Non-Inverting
• Logical Function: Latched Transceiver
• Operating Supply Voltage (min): 4.75V
• Operating Supply Voltage (max): 5.25V
• Quiescent Current (typ): 10uA
• Technology: CMOS
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 24
• Lead Free Status / Rohs Status: Not Compliant

PIN CONFIGURATION
PIN DESCRIPTION
IDT74FCT2543AT/CT
FAST CMOS OCTAL LATCHED TRANSCEIVER
Pin Names
OEAB
OEBA
CEAB
CEBA
LEAB
LEBA
A
B
0
0
–A
–B
7
7
OEBA
CEAB
LEBA
GND
A
A
A
A
A
A
A
A
0
1
2
3
4
5
6
7
A-to-B Output Enable Input (Active LOW)
B-to-A Output Enable Input (Active LOW)
A-to-B Enable Input (Active LOW)
B-to-A Enable Input (Active LOW)
A-to-B Latch Enable Input (Active LOW)
B-to-A Latch Enable Input (Active LOW)
A-to-B Data Inputs or B-to-A 3-State Outputs
B-to-A Data Inputs or A-to-B 3-State Outputs
1
2
3
4
5
6
7
8
9
10
11
12
SOIC/ QSOP
TOP VIEW
Description
24
23
22
21
20
19
18
17
16
15
14
13
V
CEBA
B
B
B
B
B
B
B
B
LEAB
OEAB
CC
0
1
2
3
4
5
6
7
2
FUNCTION TABLE
For A-to-B (Symmetric with B-to-A)
ABSOLUTE MAXIMUM RATINGS
CAPACITANCE
NOTE:
1. This parameter is measured at characterization but not tested.
NOTES:
1. * Before LEAB LOW-to-HIGH Transition
2. A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
C
Symbol
V
V
T
I
Symbol
C
OUT
CEAB
STG
H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
and OEBA.
TERM
TERM
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
IN
OUT
H
X
X
L
L
(2)
(3)
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
LEAB
Input Capacitance
Output Capacitance
Inputs
H
H
X
X
L
Parameter
OEAB
Description
H
X
X
L
L
(1)
(T
A
INDUSTRIAL TEMPERATURE RANGE
= +25°C, F = 1.0MHz)
Conditions
(1, 2)
V
Transparent
V
OUT
IN
Status
A-to-B
Storing
Storing
Storing
Latch
= 0V
X
= 0V
–0.5 to V
Typ.
–65 to +150
–60 to +120
6
8
–0.5 to +7
Previous* A Inputs
Current A Inputs
Max
Buffers
CC
Output
High Z
High Z
B
Max.
0
+0.5
10
12
–B
X
(1)
7
Unit
Unit
pF
pF
mA
° C
V
V