MJ10007 ON Semiconductor, MJ10007 Datasheet - Page 4

• Manufacturer Part Number: MJ10007
• Manufacturer: ON Semiconductor

have been defined and apply to both current and voltage
waveforms since they are in phase. However, for inductive
loads which are common to SWITCHMODE power
supplies and hammer drivers, current and voltage
waveforms are not in phase. Therefore, separate
In resistive switching circuits, rise, fall, and storage times
Figure 7. Inductive Switching Measurements
L
R
V
coil
coil
clamp
PW Varied to Attain
I
C
= 10 mH, V
= 0.7
= 250 mA
= V
V
SWITCHING TIMES NOTE
CEO(sus)
CEO(sus)
INDUCTIVE TEST CIRCUIT
CC
= 10 V
Table 1. Test Conditions for Dynamic Performance
L
R
V
f
V
o
coil
CC
coil
CEX(sus)
= 500 kHz
= 180 H
= 20 V
= 0.05
OUTPUT WAVEFORMS
http://onsemi.com
AND INDUCTIVE SWITCHING
MJ10007
4
V
clamp
measurements must be made on each waveform to
determine the total switching time. For this reason, the
following new terms have been defined.
t
t
t
t
t
in Figure 7 to aid in the visual identity of these terms.
storage time and the predominant switching power losses
occur during the crossover interval and can be obtained
using the standard equation from AN–222.
this relationship may not be valid.
switching is specified at 25_C and has become a benchmark
for designers. However, for designers of high frequency
converter circuits, the user oriented specifications which
make this a “SWITCHMODE” transistor are the inductive
switching speeds (t
sv
rv
fi
ti
c
= Crossover Time, 10% V
An enlarged portion of the turn–off waveforms is shown
For the designer, there is minimal switching loss during
In general, t
As is common with most switching transistors, resistive
= Current Fall Time, 90–10% I
= Current Tail, 10–2% I
= Rated V
= Voltage Rise Time, 10–90% V
= Voltage Storage Time, 90% I
INDUCTIVE TEST CIRCUIT
CEX
[
Value
rv
+ t
Scope — Tektronix
P
475 or Equivalent
t
Obtain I
t
t
1
1
2
Test Equipment
c
SWT
Adjusted to
fi
and t
] t
L
L
coil
coil
V
C
V
Clamp
= 1/2 V
CC
sv
(I
(I
c
C
C
. However, at lower test currents
C
) which are guaranteed at 100_C.
pk
pk
)
)
clamp
CC
C
to 10% I
B1
I
C
clamp
RESISTIVE SWITCHING
RESISTIVE TEST CIRCUIT
(t
to 10% V
c
) f
V
R
Pulse Width = 50 s
CC
L
= 50
C
= 250 V
clamp