AD7923 Analog Devices, AD7923 Datasheet - Page 6

• Manufacturer Part Number: AD7923
• Description: 4-Channel 200 kSPS, 12-Bit A/D Converter with Sequencer in 16-Lead TSSOP
• Manufacturer: Analog Devices

Specifications of AD7923

• Resolution (bits): 12bit
• # Chan: 4
• Sample Rate: 200kSPS
• Interface: Ser,SPI
• Analog Input Type: SE-Uni
• Ain Range: Uni (Vref),Uni (Vref) x 2
• Adc Architecture: SAR
• Pkg Type: SOP

AD7923
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
AV
V
Analog Input Voltage to AGND
Digital Input Voltage to AGND
Digital Output Voltage to AGND
REF
Input Current to Any Pin Except
Operating Temperature Range
Commercial (B Version)
Storage Temperature Range
Junction Temperature
TSSOP Package, Power Dissipation
θ
θ
Lead Temperature, Soldering
Pb-free Temperature, Soldering
ESD
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Transient currents of up to 100 mA do not cause SCR latchup.
JA
JC
DRIVE
A
Supplies
Vapor Phase (60 sec)
Infrared (15 sec)
Reflow
DD
= 25°C, unless otherwise noted.
Thermal Impedance
Thermal Impedance
IN
to AGND
to AGND
to AGND
1
Rating
−0.3 V to +7 V
−0.3 V to AV
−0.3 V to AV
−0.3 V to +7 V
−0.3 V to AV
−0.3 V to AV
±10 mA
−40°C to +125°C
−65°C to +150°C
150°C
450 mW
150.4°C/W (TSSOP)
27.6°C/W (TSSOP)
215°C
220°C
260(+0)°C
1.5 kV
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. C | Page 6 of 24
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.