ACS20D Intersil Corporation, ACS20D Datasheet - Page 4

• Manufacturer Part Number: ACS20D
• Description: Radiation Hardened Dual 4-input NAND Gate
• Manufacturer: Intersil Corporation

NOTE:
NOTE:
NOTES:
NOTE:
1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.
1. Except FN test which will be performed 100% Go/No-Go.
1. Each lead except VCC and GND will have a series resistor of 500
2. No-connect pins 3 and 11 may be connected to any voltage level.
1. Each pin except VCC and GND will have a series resistor of 47k
Initial Test (Preburn-In)
Interim Test 1 (Postburn-In)
Interim Test 2 (Postburn-In)
PDA
Interim Test 3 (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
CONFORMANCE GROUP
Group E Subgroup 2
STATIC 1 BURN-IN (Notes 1, 2)
STATIC 2 BURN-IN (Notes 1, 2)
DYNAMIC BURN-IN (Notes 1, 2)
Irradiation Circuit (Note 1)
CONFORMANCE GROUPS
OPEN
FUNCTION
-
-
-
Subgroup B-5
Subgroup B-6
1, 2, 4, 5, 7, 9, 10,
METHOD
TABLE 8. BURN-IN TEST CONNECTIONS (+125
5005
GROUND
12, 13
7
7
TABLE 9. IRRADIATION TEST CONNECTIONS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Specifications ACS20MS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
3, 6, 8, 11
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
OPEN
PRE RAD
1, 7, 9
1/2 VCC = 3V 0.5V
3, 6, 8, 11
3, 6, 8, 11
3, 6, 8, 11
TEST
4
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
5%.
POST RAD
2, 3, 8A, 8B, 10, 11
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
GROUND
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
VCC = 6V 0.5V
o
7
1, 2, 4, 5, 9,
C < TA < 139
10, 12, 13
14
14
PRE RAD
o
C)
1, 9
READ AND RECORD
1, 2, 4, 5, 9, 10, 11, 12, 13, 14
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
1, 2, 4, 5, 9,
10, 12, 13
50kHz
READ AND RECORD
VCC = 5V 0.5V
Spec Number
-
-
OSCILLATOR
Table 4 (Note 1)
POST RAD
25kHz
-
-
-
518815