ACS630D Intersil Corporation, ACS630D Datasheet

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ACS630D

Manufacturer Part Number
ACS630D
Description
Radiation Hardened Edac ( Error Detection And Correction Circuit )
Manufacturer
Intersil Corporation
Datasheet
January 1996
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
Features
• Devices QML Qualified in Accordance with MIL-PRF-38535
• Detailed Electrical and Screening Requirements are Contained in
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si)
• Single Event Upset (SEU) Immunity: <1 x 10
• SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm
• Dose Rate Upset . . . . . . . . . . . . . . . . >10
• Dose Rate Survivability . . . . . . . . . . . >10
• Latch-Up Free Under Any Conditions
• Military Temperature Range . . . . . . . . . . . . . . . . . . -55
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
• Input Logic Levels
• Input Current
• Fast Propagation Delay . . . . . . . . . . . . . . . . 37ns (Max), 24ns (Typ)
Description
The Intersil ACS630MS is a Radiation Hardened 16-bit parallel error
detection and correction circuit. It uses a modified Hamming code to
generate a 6-bit check word from each 16-bit data word. The check word
is stored with the data word during a memory write cycle; during a
memory read cycle a 22-bit word is taken form memory and checked for
errors. Single bit errors in the data words are flagged and corrected.
Single bit errors in check words are flagged but not corrected. The
position of the incorrect bit is pinpointed, in both cases, by the 6-bit error
syndrome code which is output during the error correction cycle.
The ACS630MS utilizes advanced CMOS/SOS technology to achieve
high-speed operation. This device is a member of a radiation hardened,
high-speed, CMOS/SOS Logic Family.
The ACS630MS is supplied in a 28 lead Ceramic Flatpack (K suffix) or a
28 Lead Ceramic Dual-In-Line Package (D suffix).
Ordering Information
5962F9671101VXC
5962F9671101VYC
ACS630D/Sample
ACS630K/Sample
ACS630HMSR
SMD# 5962-96711 and Intersil’ QM Plan
(Typ)
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
PART NUMBER
1 A at VOL, VOH
|
TEMPERATURE RANGE
Copyright
-55
-55
o
o
C to +125
C to +125
25
25
25
©
o
o
o
Intersil Corporation 1999
C
C
C
11
12
o
o
C
C
RAD (Si)/s, 20ns Pulse
RAD (Si)/s, 20ns Pulse
-10
MIL-PRF-38535 Class V
MIL-PRF-38535 Class V
Sample
Sample
Die
Errors/Bit/Day
o
C to +125
(Error Detection and Correction Circuit)
1
SCREENING LEVEL
2
/mg
o
C
ACS630MS
Pinouts
DB10
DB11
GND
28 PIN CERAMIC DUAL-IN-LINE, MIL-STD-1835
DEF
DB0
DB1
DB2
DB3
DB4
DB5
DB6
DB7
DB8
DB9
28 PIN CERAMIC FLATPACK, MIL-STD-1835
DESIGNATOR CDFP3-F28, LEAD FINISH C
DESIGNATOR CDIP2-T28, LEAD FINISH C
Radiation Hardened EDAC
DB10
DB11
GND
DEF
DB0
DB1
DB2
DB3
DB4
DB5
DB6
DB7
DB8
DB9
10
11
12
13
14
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28 Lead SBDIP
28 Lead Ceramic Flatpack
28 Lead SBDIP
28 Lead Ceramic Flatpack
Die
TOP VIEW
TOP VIEW
Spec Number
PACKAGE
File Number
28
27
26
25
24
23
22
21
20
19
18
17
16
15
28
27
26
25
24
23
22
21
20
19
18
17
16
15
VCC
SEF
S1
S0
CB0
CB1
CB2
CB3
CB4
CB5
DB15
DB14
DB13
DB12
518781
3199.1
VCC
SEF
S1
S0
CB0
CB1
CB2
CB3
CB4
CB5
DB15
DB14
DB13
DB12

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