nb100lvep222 ON Semiconductor, nb100lvep222 Datasheet - Page 5

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nb100lvep222

Manufacturer Part Number
nb100lvep222
Description
2.5 V/3.3 V 1 15 Differential Ecl/pecl ??1/??2 Clock Driver
Manufacturer
ON Semiconductor
Datasheet

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Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Table 4. MAXIMUM RATINGS
V
V
V
I
I
T
T
q
q
q
q
T
out
BB
Symbol
A
stg
JA
JC
JA
JC
sol
CC
EE
I
/V
CC0
PECL Mode Power Supply
NECL Mode Power Supply
PECL Mode Input Voltage
NECL Mode Input Voltage
Output Current
V
Operating Temperature Range
Storage Temperature Range
Thermal Resistance (Junction-to-Ambient)
(See Application Information)
Thermal Resistance (Junction-to-Case)
(See Application Information)
Thermal Resistance (Junction-to-Ambient)
(Note )
Thermal Resistance (Junction-to-Case)
(Note )
Wave Solder
BB
Sink/Source
Table 3. ATTRIBUTES
1. For additional information, refer to Application Note AND8003/D.
Internal Input Pulldown Resistor
Internal Input Pullup Resistor
ESD Protection
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
Flammability Rating
Transistor Count
Meets or Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
Parameter
Characteristics
NB100LVEP222
http://onsemi.com
V
V
V
V
Continuous
Surge
0 lfpm
500 lfpm
0 lfpm
500 lfpm
0 lfpm
500 lfpm
2S2P
< 2 to 3 sec @ 248°C
EE
CC
EE
CC
Oxygen Index: 28 to 34
Charged Device Model
/V
/V
Condition 1
= 0 V
= 0 V
Human Body Model
CC0
CC0
5
= 0 V
= 0 V
Machine Model
LQFP-52
QFN-52
V
V
LQFP-52
LQFP-52
LQFP-52
LQFP-52
QFN-52
QFN-52
QFN-52
I
I
≤ V
≥ V
Condition 2
Pb Pkg
Level 2
CC
EE
UL 94 V-O @ 0.125 in
/V
-
CC0
821 Devices
37.5 kW
> 200 V
> 2 kV
> 2 kV
75 kW
Value
Pb-Free Pkg
Level 3
Level 2
-65 to +150
-40 to +85
Rating
-6 to 0
6 to 0
±0.5
35.6
19.6
100
265
3.2
6.4
-6
50
30
25
21
6
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
Unit
mA
mA
mA
°C
°C
°C
V
V
V
V

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