tda5360uk NXP Semiconductors, tda5360uk Datasheet - Page 22

• Manufacturer Part Number: tda5360uk
• Description: Pre-amplifier For Hard Disk Drive With Mr-read / Inductive Write Heads
• Manufacturer: NXP Semiconductors

Note 9a : RSTDMY define DRN pin functionality
Note 9b : MODE1,MODE0 power management control bits
Note 11a : ENFST define BFAST pin functionality when Thermal Asperity Compression is ON
Note 11b : Thermal Asperity Compression ( TAC ) functionality
Philips Semiconductors
1998 July 30
Pre-Amplifier for Hard Disk Drive with
MR-Read / Inductive Write Heads
- Temperature digitizer
This measurement can be done either in Active Read mode or in Active Write mode.
- Test mode is a state where both Reader and Writer are ON when R/W pin is LOW : in write mode, reader
signal is present at RDP-RDN output pins.
- (A2=A1=1 and STWN=0) is a broadcast mode condition, where all the preamps will treat the data arriving on
SDATA line.
- In order to get two write head selected, Head Hx should be programmed in Reg. 00 (x = 0 to 5). In that case
Head Hx and Head H(x+6) will be selected in STW (Servo Track Write) 2 heads.
When a thermal asperity occurs at the reader input, the reader output signal get superposed with an amplified
signal corresponding, to a certain extent, to the thermal asperity.
RSTDMY
CS1 CS0
CS1 CS0
CS1 CS0
CS1 CS0
A2
HIGH
HIGH
LOW
LOW
1
1
1
A1
1
1
1
Mode1 Mode0 STWN
ENFST
0
0
1
1
1
1
x
HIGH
LOW
0
1
0
0
1
1
x
HIGH
HIGH
LOW
LOW
DRN
inhibit BFAST control of the passband
enable BFAST control of the passband
1
0
1
0
1
x
x
22
BFAST functionality
Active STW with 2 heads in write mode
Serial Interface register reset
No effect
No effect
Dummy Head selected in read mode
Forbidden : no change in register
Active STW with one head
Active Read or Write
Test mode
Standby
Sleep
Function
Objective Specification, Revision 2.2
TDA5360