nlas4599 ON Semiconductor, nlas4599 Datasheet - Page 2

• Manufacturer Part Number: nlas4599
• Description: Single Spdt Analog Switch Single Supply
• Manufacturer: ON Semiconductor

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Tested to EIA/JESD22−A114−A
2. Tested to EIA/JESD22−A115−A
3. Tested to JESD22−C101−A
4. Tested to EIA/JESD78
DEVICE JUNCTION TEMPERATURE VERSUS TIME
TO 0.1% BOND FAILURES
ABSOLUTE MAXIMUM RATINGS
RECOMMENDED OPERATING CONDITIONS
V
V
V
I
P
T
T
T
V
I
q
V
V
V
T
t
IK
LATCH−UP
r
Temperature 5C
JA
A
, t
STG
L
J
Symbol
CC
IS
IN
D
ESD
Symbol
CC
IN
IS
f
Junction
100
110
120
130
140
80
90
Positive DC Supply Voltage
Analog Input Voltage (V
Digital Select Input Voltage
DC Current, Into or Out of Any Pin
Power Dissipation in Still Air
Storage Temperature Range
Lead Temperature, 1mm from Case for 10 seconds
Junction Temperature Under Bias
ESD Withstand Voltage
Latch−Up Performance
Thermal Resistance
DC Supply Voltage
Digital Select Input Voltage
Analog Input Voltage (NC, NO, COM)
Operating Temperature Range
Input Rise or Fall Time,
SELECT
Time, Hours
1,032,200
419,300
178,700
79,600
37,000
17,800
8,900
NO
or V
Characteristics
Above V
COM
Time, Years
Parameter
)
117.8
47.9
20.4
9.4
4.2
2.0
1.0
CC
http://onsemi.com
and Below GND at 125°C (Note 4)
Charged Device Model (Note 3)
NLAS4599
Human Body Model (Note 1)
V
V
CC
CC
2
Machine Model (Note 2)
= 3.3 V + 0.3 V
= 5.0 V + 0.5 V
Figure 3. Failure Rate vs. Time Junction Temperature
1
1
TSOP−6
TSOP−6
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
SC−88
SC−88
−0.5 ≤ V
10
GND
GND
Min
−55
2.0
TIME, YEARS
−0.5 ≤ V
0
0
−0.5 to +7.0
−65 to +150
Value
IS
$300
2000
$50
N/A
200
200
260
150
200
333
333
≤ V
I
≤ + 7.0
CC
+125
Max
V
100
)0.5
5.5
5.5
20
100
CC
°C/W
1000
Unit
Unit
ns/V
mW
mA
mA
°C
°C
°C
°C
V
V
V
V
V
V
V