k4s511632b-ul75 Samsung Semiconductor, Inc., k4s511632b-ul75 Datasheet - Page 12

• Manufacturer Part Number: k4s511632b-ul75
• Description: 512mb B-die Sdram Specification
• Manufacturer: Samsung Semiconductor, Inc.

AC CHARACTERISTICS
Notes :
DQ BUFFER OUTPUT DRIVE CHARACTERISTICS
SDRAM 512Mb B-die (x4, x8, x16)
Notes :
CLK cycle time
CLK to valid
output delay
Output data
hold time
CLK high pulse width
CLK low pulse width
Input setup time
Input hold time
CLK to output in Low-Z
CLK to output
in Hi-Z
Output rise time
Output fall time
Output rise time
Output fall time
Parameter
1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
1. Rise time specification based on 0pF + 50 : to V
2. Fall time specification based on 0pF + 50 : to V
3. Measured into 50pF only, use these values to characterize to.
4. All measurements done with respect to V
If tr & tf is longer than 1ns, transient time compensation should be considered,
i.e., [(tr + tf)/2-1]ns should be added to the parameter.
Parameter
CAS latency=3
CAS latency=2
CAS latency=3
CAS latency=2
CAS latency=3
CAS latency=2
CAS latency=3
CAS latency=2
Symbol
trh
trh
tfh
tfh
(AC operating conditions unless otherwise noted)
Symbol
t
t
t
t
t
t
t
SAC
t
t
SHZ
SLZ
CC
OH
CH
SH
CL
SS
Measure in linear
region : 1.2V ~ 1.8V
Measure in linear
region : 1.2V ~ 1.8V
Measure in linear
region : 1.2V ~ 1.8V
Measure in linear
region : 1.2V ~ 1.8V
Condition
SS
.
DD
SS
, use these values to design to.
, use these values to design to.
Min
7.5
2.5
2.5
1.5
0.8
10
3
3
1
1.37
1.30
Min
2.8
2.0
75
Typ
3.9
2.9
Revision. 1.1 August 2004
1000
Max
4.37
Max
5.4
5.4
5.4
5.6
5.0
3.8
6
CMOS SDRAM
Volts/ns
Volts/ns
Volts/ns
Volts/ns
Unit
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes
1,2
1,2
3
3
Note
1, 2
1
2
3
3
3
3
2