saa4997h NXP Semiconductors, saa4997h Datasheet - Page 5

• Manufacturer Part Number: saa4997h
• Description: Vertical Reconstruction Ic Veric For Palplus
• Manufacturer: NXP Semiconductors

Philips Semiconductors
PINNING
1996 Oct 24
Y_VE_1
Y_VE_0
U_VE_1
U_VE_0
V_VE_1
V_VE_0
V
V
n.c.
n.c.
n.c.
n.c.
n.c.
n.c.
n.c.
n.c.
HREF_MA
n.c.
VA_AI
INTPOL
FILM
EVEN_FIELD
CLK_16B2
V
V
TCK
TMS
TDI
TDO_VE
TRSTN
n.c.
n.c.
TEST1
TEST2
TEST3
CLK_32B3
V
SS1
DD1
SS2
DD2
SS3
VErtical Reconstruction IC (VERIC) for
PALplus
SYMBOL
PIN
10
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
11
1
2
3
4
5
6
7
8
9
output
output
output
output
output
output
input
input
input
input
input
input
input
input
input
input
input
input
input
output
input
tbf
tbf
tbf
input
input
TYPE
luminance output data bit 1
luminance output data bit 0
chrominance output data bit 1 U-component
chrominance output data bit 0 U-component
chrominance output data bit 1 V-component
chrominance output data bit 0 V-component
ground 1
positive supply voltage 1 (+5 V)
not connected
not connected
not connected
not connected
not connected
not connected
not connected
not connected
horizontal reference
not connected
vertical reference pulse related to output data
INTPOL = 1: PALplus interpolation active
INTPOL = 0: VERIC switched to bypass mode (standard signal)
FILM = 0: CAMERA mode
FILM = 1: FILM mode
EVEN_FIELD = 0: odd field related to MACPACIC input data
EVEN_FIELD = 1: even field related to MACPACIC input data
buffered clock input (16 MHz)
ground 2
positive supply voltage 2 (+5 V)
boundary scan test clock input
boundary scan test mode select input
boundary scan test data input
boundary scan test data output
boundary scan test reset input
not connected
not connected
test pins
buffered clock input (32 MHz)
ground 3
5
DESCRIPTION
Preliminary specification
SAA4997H