74HC4052D-Q100 NXP Semiconductors, 74HC4052D-Q100 Datasheet

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74HC4052D-Q100

Manufacturer Part Number
74HC4052D-Q100
Description
Encoders, Decoders, Multiplexers & Demultiplexers 4-ChanMux/Demux 10V
Manufacturer
NXP Semiconductors
Datasheet

Specifications of 74HC4052D-Q100

Product
Multiplexers / Demultiplexers
Logic Family
74HC
Number Of Lines (input / Output)
4 / 4
Propagation Delay Time
90 ns
Supply Voltage - Max
10 V
Supply Voltage - Min
2 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
Package / Case
SO-16
Minimum Operating Temperature
- 40 C
Number Of Input Lines
4
Number Of Output Lines
4
Operating Temperature Range
- 40 C to + 125 C
Operating Voltage
2 V to 10 V
Power Dissipation
500 mW
Part # Aliases
74HC4052D-Q100,118
1. General description
2. Features and benefits
The 74HC4052-Q100; 74HCT4052-Q100 is a high-speed Si-gate CMOS device and is pin
compatible with Low-power Schottky TTL (LSTTL). The device is specified in compliance
with JEDEC standard no. 7A.
The 74HC4052-Q100; 74HCT4052-Q100 is a dual 4-channel analog
multiplexer/demultiplexer with common select logic. Each multiplexer has four
independent inputs/outputs (pins nY0 to nY3) and a common input/output (pin nZ). The
common channel select logics include two digital select inputs (pins S0 and S1) and an
active LOW enable input (pin E). When pin E = LOW, one of the four switches is selected
(low-impedance ON-state) with pins S0 and S1. When pin E = HIGH, all switches are in
the high-impedance OFF-state, independent of pins S0 and S1.
V
The V
for the 74HCT4052-Q100. The analog inputs/outputs (pins nY0 to nY3 and nZ) can swing
between V
10.0 V. For operation as a digital multiplexer/demultiplexer, V
(typically ground).
This product has been qualified to the Automotive Electronics Council (AEC) standard
Q100 (Grade 1) and is suitable for use in automotive applications.
CC
74HC4052-Q100; 74HCT4052-Q100
Dual 4-channel analog multiplexer/demultiplexer
Rev. 2 — 22 November 2012
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Wide analog input voltage range from 5 V to +5 V
Low ON resistance:
Logic level translation: to enable 5 V logic to communicate with 5 V analog signals
Typical ‘break before make’ built-in
ESD protection:
Multiple package options
and GND are the supply voltage pins for the digital control inputs (pins S0, S1 and E).
CC
Specified from 40 C to +85 C and from 40 C to +125 C
80  (typical) at V
70  (typical) at V
60  (typical) at V
MIL-STD-883, method 3015 exceeds 2000 V
HBM JESD22-A114F exceeds 2000 V
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )
CDM AEC-Q100-011 revision B exceeds 1000 V
to GND ranges are 2.0 V to 10.0 V for the 74HC4052-Q100, and 4.5 V to 5.5 V
CC
as a positive limit and V
CC
CC
CC
 V
 V
 V
EE
EE
EE
= 4.5 V
= 6.0 V
= 9.0 V
EE
as a negative limit. V
EE
CC
is connected to GND
 V
Product data sheet
EE
may not exceed

Related parts for 74HC4052D-Q100

74HC4052D-Q100 Summary of contents

Page 1

Dual 4-channel analog multiplexer/demultiplexer Rev. 2 — 22 November 2012 1. General description The 74HC4052-Q100; 74HCT4052-Q100 is a high-speed Si-gate CMOS device and is pin compatible with Low-power Schottky TTL (LSTTL). The device is specified in compliance with ...

Page 2

... Analog multiplexing and demultiplexing  Digital multiplexing and demultiplexing  Signal gating 4. Ordering information Table 1. Ordering information Type number Package Temperature range Name 40 C to +125 C 74HC4052D-Q100 74HCT4052D-Q100 40 C to +125 C 74HC4052PW-Q100 74HCT4052PW-Q100 40 C to +125 C 74HC4052BQ-Q100 74HCT4052BQ-Q100 5. Functional diagram ...

Page 3

... NXP Semiconductors from logic Fig 3. Schematic diagram (one switch Fig 4. Functional diagram 74HC_HCT4052_Q100 Product data sheet 74HC4052-Q100; 74HCT4052-Q100 Dual 4-channel analog multiplexer/demultiplexer LOGIC 1-OF-4 LEVEL DECODER CONVERSION All information provided in this document is subject to legal disclaimers. ...

Page 4

... NXP Semiconductors 6. Pinning information 6.1 Pinning 74HC4052-Q100 74HCT4052-Q100 1 2Y0 2Y2 2Y3 4 2Y1 GND aaa-003162 Fig 5. Pin configuration for SO16 and TSSOP16 6.2 Pin description Table 2. Pin description Symbol Pin 2Y0, 2Y1, 2Y2, 2Y3 1Z ...

Page 5

... NXP Semiconductors 7. Functional description 7.1 Function table [1] Table 3. Function table Input [ HIGH voltage level LOW voltage level don’t care. 8. Limiting values Table 4. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced GND (ground = 0 V) ...

Page 6

... NXP Semiconductors 9. Recommended operating conditions Table 5. Recommended operating conditions Symbol Parameter V supply voltage CC V input voltage I V switch voltage SW T ambient temperature amb t/V input transition rise and fall rate 12 V GND CC (V) 8 operating area Fig 7. Guaranteed operating area as a function of the ...

Page 7

... NXP Semiconductors 10. Static characteristics Table 6. R resistance per switch for 74HC405-Q100 and 74HCT4052-Q100 for test circuit see the input voltage at a nYn or nZ terminal, whichever is assigned as an input the output voltage at a nYn or nZ terminal, whichever is assigned as an output. ...

Page 8

... NXP Semiconductors Table 6. R resistance per switch for 74HC405-Q100 and 74HCT4052-Q100 for test circuit see the input voltage at a nYn or nZ terminal, whichever is assigned as an input the output voltage at a nYn or nZ terminal, whichever is assigned as an output. ...

Page 9

... NXP Semiconductors Table 7. Static characteristics for 74HC4052-Q100 Voltages are referenced to GND (ground = 0 V the input voltage at pins nYn or nZ, whichever is assigned as an input the output voltage at pins nZ or nYn, whichever is assigned as an output. os Symbol Parameter = 40 C to +85 C ...

Page 10

... NXP Semiconductors Table 7. Static characteristics for 74HC4052-Q100 Voltages are referenced to GND (ground = 0 V the input voltage at pins nYn or nZ, whichever is assigned as an input the output voltage at pins nZ or nYn, whichever is assigned as an output. os Symbol Parameter I OFF-state leakage S(OFF) current ...

Page 11

... NXP Semiconductors Table 8. Static characteristics for 74HCT4052-Q100 Voltages are referenced to GND (ground = 0 V the input voltage at pins nYn or nZ, whichever is assigned as an input the output voltage at pins nZ or nYn, whichever is assigned as an output. os Symbol Parameter V LOW-level input IL voltage I input leakage current ...

Page 12

... NXP Semiconductors 11. Dynamic characteristics Table 9. Dynamic characteristics for 74HC4052-Q100 GND = ns pF; for test circuit see the input voltage at a nYn or nZ terminal, whichever is assigned as an input the output voltage at a nYn or nZ terminal, whichever is assigned as an output. ...

Page 13

... NXP Semiconductors Table 9. Dynamic characteristics for 74HC4052-Q100 GND = ns pF; for test circuit see the input voltage at a nYn or nZ terminal, whichever is assigned as an input the output voltage at a nYn or nZ terminal, whichever is assigned as an output. ...

Page 14

... NXP Semiconductors Table 10. Dynamic characteristics for 74HCT4052-Q100 GND = ns pF; for test circuit see the input voltage at a nYn or nZ terminal, whichever is assigned as an input the output voltage at a nYn or nZ terminal, whichever is assigned as an output. ...

Page 15

... NXP Semiconductors E, Sn inputs For 74HC4052-Q100 For 74HCT4052-Q100 Fig 14. Turn-on and turn-off times Definitions for test circuit; see R = termination resistance should be equal to the output impedance load capacitance including jig and probe capacitance load resistance Test selection switch. ...

Page 16

... NXP Semiconductors Table 11. Test data Test Input PHL PLH [ PZH PHZ [ PZL PLZ [ ns; when measuring max [2] V values For 74HC4052-Q100 For 74HCT4052-Q100 12. Additional dynamic characteristics Table 12. Additional dynamic characteristics Recommended conditions and typical values ...

Page 17

... NXP Semiconductors Fig 16. Test circuit for measuring sine-wave distortion V = 4.5 V; GND = Test circuit 0 iso (dB 100 10 b. Isolation (OFF-state function of frequency Fig 17. Test circuit for measuring isolation (OFF-state) 74HC_HCT4052_Q100 Product data sheet 74HC4052-Q100; 74HCT4052-Q100 Dual 4-channel analog multiplexer/demultiplexer ...

Page 18

... NXP Semiconductors Fig 18. Test circuits for measuring crosstalk between any two switches/multiplexers G Fig 19. Test circuit for measuring crosstalk between control input and any switch 74HC_HCT4052_Q100 Product data sheet 74HC4052-Q100; 74HCT4052-Q100 Dual 4-channel analog multiplexer/demultiplexer 0 nYn/nZ nZ/nYn GND ...

Page 19

... NXP Semiconductors V = 4.5 V; GND = Test circuit (dB Typical frequency response Fig 20. Test circuit for frequency response 74HC_HCT4052_Q100 Product data sheet 74HC4052-Q100; 74HCT4052-Q100 Dual 4-channel analog multiplexer/demultiplexer nYn/nZ nZ/nYn GND EE = 4  k ...

Page 20

... NXP Semiconductors 13. Package outline SO16: plastic small outline package; 16 leads; body width 3 pin 1 index 1 DIMENSIONS (inch dimensions are derived from the original mm dimensions) A UNIT max. 0.25 1.45 mm 1.75 0.25 0.10 1.25 0.010 0.057 inches 0.069 0.01 0.004 0.049 Note 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. ...

Page 21

... NXP Semiconductors TSSOP16: plastic thin shrink small outline package; 16 leads; body width 4 pin 1 index 1 DIMENSIONS (mm are the original dimensions) A UNIT max. 0.15 0.95 mm 1.1 0.25 0.05 0.80 Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic interlead protrusions of 0.25 mm maximum per side are not included. ...

Page 22

... NXP Semiconductors DHVQFN16: plastic dual in-line compatible thermal enhanced very thin quad flat package; no leads; 16 terminals; body 2.5 x 3.5 x 0.85 mm terminal 1 index area terminal 1 index area DIMENSIONS (mm are the original dimensions) (1) A UNIT max. 0.05 0. 0.2 0.00 0.18 Note 1. Plastic or metal protrusions of 0.075 mm maximum per side are not included. ...

Page 23

... NXP Semiconductors 14. Abbreviations Table 13. Abbreviations Acronym Description CMOS Complementary Metal Oxide Semiconductor DUT Device Under Test ESD ElectroStatic Discharge HBM Human Body Model MM Machine Model MIL Military 15. Revision history Table 14. Revision history Document ID Release date 74HC_HCT4052_Q100 v.2 20121122 • Modifications: 74HC_HCT4052_Q100 v.1 20120720 ...

Page 24

... Terms and conditions of commercial sale of NXP Semiconductors. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice ...

Page 25

... NXP Semiconductors No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control — This document as well as the item(s) described herein may be subject to export control regulations ...

Page 26

... NXP Semiconductors 18. Contents 1 General description . . . . . . . . . . . . . . . . . . . . . . 1 2 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 6 Pinning information . . . . . . . . . . . . . . . . . . . . . . 4 6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4 7 Functional description . . . . . . . . . . . . . . . . . . . 5 7.1 Function table . . . . . . . . . . . . . . . . . . . . . . . . . . 5 8 Limiting values Recommended operating conditions Static characteristics Dynamic characteristics . . . . . . . . . . . . . . . . . 12 12 Additional dynamic characteristics ...

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