CAT28F020G-90T ON Semiconductor, CAT28F020G-90T Datasheet - Page 5

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CAT28F020G-90T

Manufacturer Part Number
CAT28F020G-90T
Description
IC FLASH 2MBIT 90NS 32PLCC
Manufacturer
ON Semiconductor
Datasheet

Specifications of CAT28F020G-90T

Format - Memory
FLASH
Memory Type
FLASH
Memory Size
2M (256K x 8)
Speed
90ns
Interface
Parallel
Voltage - Supply
4.75 V ~ 5.25 V
Operating Temperature
0°C ~ 70°C
Package / Case
32-PLCC
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
CAT28F020G-90T
CAT28F020G-90TTR

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CAT28F020G-90T
Manufacturer:
ON Semiconductor
Quantity:
10 000
Note:
1.
2.
3.
4.
5.
6.
7.
8.
SUPPLY CHARACTERISTICS
A.C. CHARACTERISTICS, Read Operation
V
Figure 1. A.C. Testing Input/Output Waveform
© 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice
Symbol
CC
t
S
JEDEC Standard
WHGL
t
V
V
t
t
t
t
t
t
t
t
y
V
AVQV
GLQV
AXQX
GLQX
GHQZ
EHQZ
AVAV
ELQV
ELQX
This parameter is tested initially and after a design or process change that affects the parameter.
Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
Input Rise and Fall Times (10% to 90%) < 10 ns.
Input Pulse Levels = 0.45 V and 2.4 V. For High Speed Input Pulse Levels 0.0 V and 3.0 V.
Input and Output Timing Reference = 0.8 V and 2.0 V. For High Speed Input and Output Timing Reference = 1.5 V.
Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
For load and reference points, see Fig. 1.
CAT28F020-90, V
m
P
P
C
= +5V 10%, unless otherwise specified. (See Note 8)
P
P
b
C
(1)
H
L
l o
Symbol
t
V
t
t
OLZ
t
DF
DF
LZ
t
P
t
t
t
V
t
ACC
OH
RC
CE
OE
(1)(6)
(1)(2)
(1)(2)
P
(1)(6)
-
P
P
D
CCMIN
V
r u
D
C
r u
n i
C
g
n i
= 4.75 V.
Parameter
Read Cycle Time
CE Access Time
Address Access Time
OE Access Time
Output Hold from Address OE/CE Change
OE to Output in Low-Z
CE to Output in Low-Z
OE High to Output High-Z
CE High to Output High-Z
Write Recovery Time Before Read
P
S
a
g
R
u
a r
e
R
p
a
0.45 V
p
m
e
Testing Load Circuit (example)
2.4 V
d
y l
a
E /
t e
d
V
a r
r e
DEVICE
UNDER
O
l o
TEST
s
p
a t
e
r e
INPUT PULSE LEVELS
P /
g
t a
e
o r
o i
g
n
a r
s
m
1.3V
2
2
(3)(4)(5)
8
8
F
F
1N914
3.3K
C L = 100 pF
0
0
2
2
0
0
5
2.0 V
0.8 V
9 -
1 -
0
2
C L INCLUDES JIG CAPACITANCE
OUT
REFERENCE POINTS
4
M
1
4
7 .
1
0
Min
5 .
n i
90
4 .
0
0
0
6
5
28F020-90
Typ
T
y
(7)
p
Max
40
90
90
35
30
Min
120
0
0
0
6
28F020-12
M
1
5
5
6
2
a
5 .
5 .
5 .
6 .
x
Typ Max
Doc. No. MD-1029, Rev. F
CAT28F020
(7)
120
120
50
30
40
U
V
V
V
V
n
t i
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
s

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